Inventor · disambiguated record
Paul C. Allen
Also filed as: ALLEN PAUL · ALLEN PAUL C
28 granted patents·2 pending applications·1,131 citations·filing 1980–2009
98Inventor score
Top patents by PatentIndex Score
30 records- 0197US4796038ALaser pattern generation apparatusATEQ CORP·Filed 1988·Granted Jan 3, 1989·254 cites·28 claims
- 0294US5227839ASmall field scannerETEC SYSTEMS INC·Filed 1991·Granted Jul 13, 1993·91 cites·15 claims
- 0392US7802685B2Multistep separation of plasticsMBA POLYMERS INC·Filed 2003·Granted Sep 28, 2010·54 cites·42 claims
- 0491US6724002B2Multiple electron beam lithography system with multiple beam modulated laser illuminationAPPLIED MATERIALS INC·Filed 2002·Granted Apr 20, 2004·41 cites·12 claims
- 0589US6828574B1Modulator driven photocathode electron beam generatorAPPLIED MATERIALS INC·Filed 2000·Granted Dec 7, 2004·35 cites·24 claims
- 0689US5386221ALaser pattern generation apparatusETEC SYSTEMS INC·Filed 1992·Granted Jan 31, 1995·88 cites·28 claims
- 0787US4797696ABeam splitting apparatusATEQ CORP·Filed 1987·Granted Jan 10, 1989·50 cites·14 claims
- 0886US6532097B1Image registration apparatus having an adjustable reflective diffraction grating and methodAPPLIED MATERIALS INC·Filed 2001·Granted Mar 11, 2003·23 cites·19 claims
- 0986US4366676ACryogenic cooler apparatusUNIV CALIFORNIA·Filed 1980·Granted Jan 4, 1983·42 cites·8 claims
- 1085US5255051ASmall field scannerETEC SYSTEMS INC·Filed 1993·Granted Oct 19, 1993·40 cites·3 claims
- 1184US7325757B2Plastics recovery systemMBA POLYMERS INC·Filed 2004·Granted Feb 5, 2008·23 cites·24 claims
- 1282US6448568B1Electron beam column using high numerical aperture photocathode source illuminationAPPLIED MATERIALS INC·Filed 1999·Granted Sep 10, 2002·48 cites·18 claims
- 1382US6037967AShort wavelength pulsed laser scannerETEC SYSTEMS INC·Filed 1996·Granted Mar 14, 2000·71 cites·28 claims
- 1478US7676562B2Computer system for accessing instrumentation informationMICROSOFT CORP·Filed 2004·Granted Mar 9, 2010·26 cites·18 claims
- 1576US5757469AScanning lithography system haing double pass Wynne-Dyson opticsETEC SYSTEMS INC·Filed 1995·Granted May 26, 1998·42 cites·30 claims
- 1671US7483196B2Apparatus for multiple beam deflection and intensity stabilizationAPPLIED MATERIALS INC·Filed 2003·Granted Jan 27, 2009·16 cites·21 claims
- 1771US5327338AScanning laser lithography system alignment apparatusETEC SYSTEMS INC·Filed 1992·Granted Jul 5, 1994·29 cites·26 claims
- 1871US4956650APattern generation systemATEQ CORP·Filed 1988·Granted Sep 11, 1990·23 cites·11 claims
- 1970US7095037B2Electron beam lithography system having improved electron gunFERNADEZ ANDRES·Filed 2004·Granted Aug 22, 2006·12 cites·30 claims
- 2066US5781346AMagnification correction for small field scanningETEC SYSTEM INC·Filed 1996·Granted Jul 14, 1998·22 cites·6 claims
- 2165US5739964AMagnification correction for small field scanningETEC SYSTEMS INC·Filed 1995·Granted Apr 14, 1998·21 cites·25 claims
- 2265US4353218AHeat pump/refrigerator using liquid working fluidUS ENERGY·Filed 1980·Granted Oct 12, 1982·18 cites·22 claims
- 2362US6751000B2Reflective diffraction of radiation beams for image registrationAPPLIED MATERIALS INC·Filed 2002·Granted Jun 15, 2004·5 cites·20 claims
- 2453US6271514B1Multi-beam scanner including a dove prism arrayETEC SYSTEMS INC·Filed 1999·Granted Aug 7, 2001·16 cites·21 claims
- 2552US6295157B1Thermally balanced acousto-optic modulatorETEC SYSTEMS INC·Filed 1999·Granted Sep 25, 2001·19 cites·12 claims
- 2651US6731320B1Laser pattern generatorAPPLIED MATERIALS INC·Filed 1999·Granted May 4, 2004·12 cites·22 claims
- 2749US6897888B2Scanning brush and method of useAPPLIED MATERIALS INC·Filed 2004·Granted May 24, 2005·2 cites·13 claims
- 2846US2010281173A1Delegated administration for remote managementMICROSOFT CORP·Filed 2009·Application pending·0 cites
- 2943US5815245AScanning lithography system with opposing motionETEC SYSTEMS INC·Filed 1995·Granted Sep 29, 1998·8 cites·23 claims
- 3040US2003048427A1Electron beam lithography system having improved electron gunAPPLIED MATERIALS INC·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →