Inventor · disambiguated record
Parthajit Bhattacharya
Also filed as: BHATTACHARYA PARTHAJIT
7 granted patents·1 pending application·3 citations·filing 2010–2017
72Inventor score
Technology areasG01R
Top patents by PatentIndex Score
8 records- 0167US10605863B2Mapping physical shift failures to scan cells for detecting physical faults in integrated circuitsSYNOPSYS INC·Filed 2017·Granted Mar 31, 2020·1 cites·20 claims
- 0263US9568550B1Identifying failure indicating scan test cells of a circuit-under-testSYNOPSYS INC·Filed 2015·Granted Feb 14, 2017·1 cites·24 claims
- 0357US8521464B2Accelerating automatic test pattern generation in a multi-core computing environment via speculatively scheduled sequential multi-level parameter value optimizationKUMAR ASHWIN·Filed 2010·Granted Aug 27, 2013·1 cites·20 claims
- 0453US9417287B2Scheme for masking output of scan chains in test circuitSYNOPSYS INC·Filed 2014·Granted Aug 16, 2016·0 cites·20 claims
- 0553US2016341795A1Scheme for Masking Output of Scan Chains in Test CircuitSYNOPSYS INC·Filed 2016·Application pending·0 cites
- 0648US10067187B2Handling of undesirable distribution of unknown values in testing of circuit using automated test equipmentSYNOPSYS INC·Filed 2014·Granted Sep 4, 2018·0 cites·19 claims
- 0745US9411014B2Reordering or removal of test patterns for detecting faults in integrated circuitSYNOPSYS INC·Filed 2014·Granted Aug 9, 2016·0 cites·20 claims
- 0844US9329235B2Localizing fault flop in circuit by using modified test patternSYNOPSYS INC·Filed 2014·Granted May 3, 2016·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →