Inventor · disambiguated record
Paul Farber
Also filed as: FARBER PAUL · FARBER PAUL S
8 granted patents·4 pending applications·129 citations·filing 1998–2013
85Inventor score
Top patents by PatentIndex Score
12 records- 0195US7312609B2GMR sensor element and its useBOSCH GMBH ROBERT·Filed 2003·Granted Dec 25, 2007·67 cites·12 claims
- 0287US7548060B2Magnetic sensor systemBOSCH GMBH ROBERT·Filed 2005·Granted Jun 16, 2009·19 cites·5 claims
- 0376US7095596B2Magnetoresistive sensor element and method for reducing the angular error of a magnetoresistive sensor elementBOSCH GMBH ROBERT·Filed 2003·Granted Aug 22, 2006·22 cites·15 claims
- 0466US9169116B2Hybrid integrated component and method for the manufacture thereofCLASSEN JOHANNES·Filed 2013·Granted Oct 27, 2015·1 cites·12 claims
- 0555US6200816B1Method for measuring particulate and gaseous metals in a fluid stream, device for measuring particulate and gaseous metals in a fluid streamUS ENERGY·Filed 1998·Granted Mar 13, 2001·20 cites·14 claims
- 0652US8148234B2Method for manufacturing a semiconductor structure, and a corresponding Semiconductor StructureLAMMEL GERHARD·Filed 2007·Granted Apr 3, 2012·0 cites·12 claims
- 0750US8492850B2Method for producing a silicon substrate having modified surface properties and a silicon substrate of said typeLAMMEL GERHARD·Filed 2007·Granted Jul 23, 2013·0 cites·5 claims
- 0847US2012132925A1Method for manufacturing a semiconductor structure, and a corresponding semiconductor structureLAMMEL GERHARD·Filed 2012·Application pending·0 cites
- 0945US9316703B2Apparatus and method for measuring magnetic fieldsSCHATZ FRANK·Filed 2012·Granted Apr 19, 2016·0 cites·15 claims
- 1039US2013320969A1Magnetic field sensorREICHENBACH FRANK·Filed 2013·Application pending·0 cites
- 1133US2012126352A1Method for manufacturing semiconductor chips, mounting method and semiconductor chip for vertical mounting onto circuit substratesBAER HANS-PETER·Filed 2011·Application pending·0 cites
- 1227US2012313638A1Magnetic field sensorPATAK CHRISTIAN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →