Inventor · disambiguated record
Pavel Potocek
Also filed as: POTOCEK PAVEL · POTOČEK PAVEL
27 granted patents·7 pending applications·54 citations·filing 2012–2025
93Inventor score
Top patents by PatentIndex Score
34 records- 0193US8586921B2Charged-particle microscope providing depth-resolved imageryBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 19, 2013·19 cites·17 claims
- 0292US12175648B2Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a methodFEI CO·Filed 2023·Granted Dec 24, 2024·2 cites·22 claims
- 0392US10928335B2Adaptive specimen image acquisition using an artificial neural networkFEI CO·Filed 2019·Granted Feb 23, 2021·4 cites·20 claims
- 0491US11488800B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2021·Granted Nov 1, 2022·2 cites·20 claims
- 0589US8704176B2Charged particle microscope providing depth-resolved imageryFEI CO·Filed 2013·Granted Apr 22, 2014·12 cites·20 claims
- 0685US12085523B2Adaptive specimen image acquisition using an artificial neural networkFEI CO·Filed 2023·Granted Sep 10, 2024·0 cites·13 claims
- 0785US9478393B2Computational scanning microscopy with improved resolutionFEI CO·Filed 2015·Granted Oct 25, 2016·6 cites·14 claims
- 0882US9934936B2Charged particle microscope with special aperture plateFEI CO·Filed 2015·Granted Apr 3, 2018·4 cites·20 claims
- 0980US2025201512A1Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1077US11282670B1Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample imagesFEI CO·Filed 2020·Granted Mar 22, 2022·1 cites·20 claims
- 1175US12288667B2Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2022·Granted Apr 29, 2025·0 cites·20 claims
- 1274US12136532B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 1372US11982634B2Adaptive specimen image acquisitionFEI CO·Filed 2021·Granted May 14, 2024·0 cites·15 claims
- 1471US10614998B2Charge reduction by digital image correlationFEI CO·Filed 2018·Granted Apr 7, 2020·2 cites·26 claims
- 1569US9711325B2Charged-particle microscope providing depth-resolved imageryFEI CO·Filed 2014·Granted Jul 18, 2017·1 cites·22 claims
- 1663US10002742B2Composite scan path in a charged particle microscopeFEI CO·Filed 2015·Granted Jun 19, 2018·1 cites·15 claims
- 1762US11482400B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2020·Granted Oct 25, 2022·0 cites·10 claims
- 1860US12223752B2Data acquisition in charged particle microscopyFEI CO·Filed 2021·Granted Feb 11, 2025·0 cites·15 claims
- 1960US2025322677A1Data acquisition in charged particle microscopyFEI CO·Filed 2025·Application pending·0 cites
- 2059US12392735B2Sparse image reconstruction from neighboring tomography tilt imagesFEI CO·Filed 2021·Granted Aug 19, 2025·0 cites·21 claims
- 2159US2024110880A1Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle SystemsFEI CO·Filed 2022·Application pending·0 cites
- 2258US12002194B2Training an artificial neural network using simulated specimen imagesFEI CO·Filed 2020·Granted Jun 4, 2024·0 cites·18 claims
- 2358US11741730B2Charged particle microscope scan masking for three-dimensional reconstructionFEI CO·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 2457US2025379028A1Detecting and adjusting lamella deformationFEI CO·Filed 2024·Application pending·0 cites
- 2556US10811223B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2018·Granted Oct 20, 2020·0 cites·17 claims
- 2655US10903043B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2018·Granted Jan 26, 2021·0 cites·12 claims
- 2749US11355305B2Low keV ion beam image restoration by machine learning for object localizationFEI CO·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 2848US10115561B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2016·Granted Oct 30, 2018·0 cites·20 claims
- 2947US10846845B2Training an artificial neural network using simulated specimen imagesFEI CO·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 3045US11380529B2Depth reconstruction for 3D images of samples in a charged particle systemFEI CO·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 3141US2020312611A1Artificial intelligence enabled volume reconstructionFEI CO·Filed 2019·Application pending·0 cites
- 3239US2020111219A1Object tracking using image segmentationFEI CO·Filed 2019·Application pending·0 cites
- 3334US10128080B2Three-dimensional imaging in charged-particle microscopyFEI CO·Filed 2017·Granted Nov 13, 2018·0 cites·20 claims
- 3432US2015279615A1Imaging a Sample with Multiple Beams and Multiple DetectorsFEI CO·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →