Inventor · disambiguated record
Patric Stracke
Also filed as: STRACKE PATRIC · STRACKE PATRIC RALPH
3 granted patents·2 pending applications·2 citations·filing 2005–2020
49Inventor score
Top patents by PatentIndex Score
5 records- 0145US7454676B2Method for testing semiconductor chips using register setsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 18, 2008·2 cites·19 claims
- 0241US12367256B2Methods for determining a limit of a tolerance interval, method for evaluating a production process and corresponding calculation deviceSANOFI SA·Filed 2020·Granted Jul 22, 2025·0 cites·20 claims
- 0341US2008129371A1Semiconductor device and trimming methodQIMONDA AG·Filed 2007·Application pending·0 cites
- 0431US7461308B2Method for testing semiconductor chips by means of bit masksINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 2, 2008·0 cites·22 claims
- 0531US2006156108A1Method for testing semiconductor chips using check bitsSTRACKE PATRIC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →