Inventor · disambiguated record
Paul Dana Wohlfarth
Also filed as: WOHLFARTH PAUL D · WOHLFARTH PAUL DANA
17 granted patents·1 pending application·651 citations·filing 1989–2009
95Inventor score
Top patents by PatentIndex Score
18 records- 0194US6356224B1Arbitrary waveform generator having programmably configurable architectureCREDENCE SYSTEMS CORP·Filed 1999·Granted Mar 12, 2002·195 cites·22 claims
- 0290US6396706B1Self-heating circuit boardCREDENCE SYSTEMS CORP·Filed 1999·Granted May 28, 2002·84 cites·12 claims
- 0387US6484117B1Predictive temperature control system for an integrated circuitCREDENCE SYSTEMS CORP·Filed 2000·Granted Nov 19, 2002·41 cites·22 claims
- 0483US5999044ADifferential driver having multiple output voltage rangesCREDENCE SYSTEMS CORP·Filed 1998·Granted Dec 7, 1999·53 cites·16 claims
- 0582US6674628B1Pulse-width modulated relayCREDENCE SYSTEMS CORP·Filed 2002·Granted Jan 6, 2004·25 cites·35 claims
- 0681US6057716AInhibitable continuously-terminated differential drive circuit for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1999·Granted May 2, 2000·44 cites·3 claims
- 0780US5015989AFilm resistor with enhanced trimming characteristicsPACIFIC HYBRID MICROELECTRONIC·Filed 1989·Granted May 14, 1991·39 cites·20 claims
- 0877US6794887B1Test head including displaceable switch elementCREDENCE SYSTEMS CORP·Filed 2001·Granted Sep 21, 2004·26 cites·9 claims
- 0976US7057410B1Interface structure for semiconductor integrated circuit test equipmentCREDENCE SYSTEMS CORP·Filed 2003·Granted Jun 6, 2006·24 cites·4 claims
- 1076US6710689B2Floating contactor relayCREDENCE SYSTEMS CORP·Filed 2001·Granted Mar 23, 2004·20 cites·44 claims
- 1176US6348785B2Linear ramping digital-to-analog converter for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 2001·Granted Feb 19, 2002·17 cites·11 claims
- 1268US6232759B1Linear ramping digital-to-analog converter for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1999·Granted May 15, 2001·25 cites·16 claims
- 1367US6329892B1Low profile, current-driven relay for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 2000·Granted Dec 11, 2001·14 cites·9 claims
- 1465US5942922AInhibitable, continuously-terminated differential drive circuit for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1998·Granted Aug 24, 1999·24 cites·22 claims
- 1555US8063725B2Form C relay and package using sameELLIS TRAVIS S·Filed 2009·Granted Nov 22, 2011·4 cites·5 claims
- 1646US6288560B1Self-soldering integrated circuit probe assemblyCREDENCE SYSTEMS CORP·Filed 1999·Granted Sep 11, 2001·12 cites·26 claims
- 1736US2006290361A1A semiconductor integrated circuit tester channel with selective bypass circuitryELLIS TRAVIS·Filed 2005·Application pending·0 cites
- 1826US6191595B1Adhesive attaching, thermal releasing flat pack probe assemblyCREDENCE SYSTEMS CORP·Filed 1999·Granted Feb 20, 2001·4 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →