Inventor · disambiguated record
Peter Ebbing
Also filed as: EBBING PETER · EBBING PETER F · EBBING PETER F M
17 granted patents·515 citations·filing 1974–1998
95Inventor score
Top patents by PatentIndex Score
17 records- 0193US6198976B1On the fly center-finding during substrate handling in a processing systemAPPLIED MATERIALS INC·Filed 1998·Granted Mar 6, 2001·145 cites·18 claims
- 0282US6155773ASubstrate clamping apparatusAPPLIED MATERIALS INC·Filed 1997·Granted Dec 5, 2000·64 cites·29 claims
- 0379US4953982AMethod and apparatus for endpoint detection in a semiconductor wafer etching systemAPPLIED MATERIALS INC·Filed 1988·Granted Sep 4, 1990·50 cites·16 claims
- 0475US5337144AEtch rate monitor using collimated light and method of using sameAPPLIED MATERIALS INC·Filed 1992·Granted Aug 9, 1994·35 cites·19 claims
- 0574US5151584AMethod and apparatus for endpoint detection in a semiconductor wafer etching systemAPPLIED MATERIALS INC·Filed 1991·Granted Sep 29, 1992·54 cites·1 claims
- 0672US3969768AMagnetic disk head carriageTRI DATA·Filed 1974·Granted Jul 13, 1976·15 cites·18 claims
- 0761US5544275AElectrically heated fluid carrying conduit having integrated heating elements and electrical conductorsAPPLIED MATERIALS INC·Filed 1993·Granted Aug 6, 1996·20 cites·17 claims
- 0856US5537508AMethod and dry vapor generator channel assembly for conveying a liquid from a liquid source to a liquid vaporizer with minimal liquid stagnationAPPLIED MATERIALS INC·Filed 1994·Granted Jul 16, 1996·27 cites·23 claims
- 0951US5465746APneumatic circuit to provide different opening and closing speeds for a pneumatic operatorAPPLIED MATERIALS INC·Filed 1994·Granted Nov 14, 1995·14 cites·5 claims
- 1050US5648847AMethod and apparatus for normalizing a laser beam to a reflective surfaceAPPLIED MATERIALS INC·Filed 1995·Granted Jul 15, 1997·14 cites·41 claims
- 1148US5129994AMethod and apparatus to inhibit obstruction of optical transmission through semiconductor etch process chamber viewportAPPLIED MATERIALS INC·Filed 1991·Granted Jul 14, 1992·21 cites·25 claims
- 1242US4813840AMethod of aligning wafers and device thereforAPPLIED MATERIALS INC·Filed 1987·Granted Mar 21, 1989·17 cites·16 claims
- 1341US5077464AMethod and apparatus for endpoint detection in a semiconductor wafer etching systemAPPLIED MATERIALS INC·Filed 1991·Granted Dec 31, 1991·11 cites·17 claims
- 1440US5219007AMethod and apparatus for reducing particulate generation caused by door or cover flexing on high vacuum equipmentAPPLIED MATERIALS INC·Filed 1991·Granted Jun 15, 1993·6 cites·6 claims
- 1537US5224581AMagnetic semiconductor wafers with handling apparatus and methodAPPLIED MATERIALS INC·Filed 1992·Granted Jul 6, 1993·10 cites·14 claims
- 1636US5263518AMethod and apparatus for reducing particulate generation caused by door or cover flexing on high vacuum equipmentAPPLIED MATERIALS INC·Filed 1991·Granted Nov 23, 1993·4 cites·6 claims
- 1736US5147828AMethod of handling magnetic semiconductor wafersAPPLIED MATERIALS INC·Filed 1989·Granted Sep 15, 1992·8 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →