Inventor · disambiguated record
Petr Hlavenka
Also filed as: HLAVENKA PETR
9 granted patents·8 pending applications·34 citations·filing 2012–2024
85Inventor score
Top patents by PatentIndex Score
17 records- 0186US11373839B1Method and system for component analysis of spectral dataFEI CO·Filed 2021·Granted Jun 28, 2022·5 cites·20 claims
- 0283US8735849B2Detector for use in charged-particle microscopyHLAVENKA PETR·Filed 2012·Granted May 27, 2014·9 cites·21 claims
- 0382US9362086B2In-column detector for particle-optical columnFEI CO·Filed 2013·Granted Jun 7, 2016·7 cites·21 claims
- 0480US9490100B2Method of using a compound particle-optical lensFEI CO·Filed 2013·Granted Nov 8, 2016·6 cites·9 claims
- 0577US10937627B2Multi-beam electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·2 cites·15 claims
- 0676US9153416B2Detection method for use in charged-particle microscopyFEI CO·Filed 2014·Granted Oct 6, 2015·2 cites·20 claims
- 0775US11002692B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2019·Granted May 11, 2021·2 cites·19 claims
- 0862US2025231127A1Elemental identification based on phase analysisFEI CO·Filed 2024·Application pending·0 cites
- 0959US9053899B2Method for imaging a sample in a charged particle apparatusFEI CO·Filed 2014·Granted Jun 9, 2015·1 cites·11 claims
- 1056US2024027377A1Method of examining a sample using a charged particle microscopeFEI CO·Filed 2023·Application pending·0 cites
- 1153US2025372341A1Method of virtual sectioning of stem sample using combination of seFEI CO·Filed 2023·Application pending·0 cites
- 1252US2025069844A1Shielded detector for charged particle microscopyFEI CO·Filed 2023·Application pending·0 cites
- 1351US11676795B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2021·Granted Jun 13, 2023·0 cites·18 claims
- 1449US2012273677A1In-column detector for particle-optical columnTUMA LUBOMIR·Filed 2012·Application pending·0 cites
- 1545US2020312610A1Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2020·Application pending·0 cites
- 1633US2018061613A1Charged-particle microscope with exchangeable pole piece extending elementFEI CO·Filed 2017·Application pending·0 cites
- 1732US2017103868A1Investigation of high-temperature specimens in a charged particle microscopeFEI CO·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →