Inventor · disambiguated record
Peter C. Jann
Also filed as: JANN PETER C
11 granted patents·2 pending applications·1,190 citations·filing 1990–2007
94Inventor score
Files withCALIPER LIFE SCIENCES INC2CALIPER TECHN CORP2PHASE METRICS2SEAGATE TECHNOLOGY LLC2TENCOR INSTRUMENTS2
Top patents by PatentIndex Score
13 records- 0199US6358387B1Ultra high throughput microfluidic analytical systems and methodsCALIPER TECHN CORP·Filed 2000·Granted Mar 19, 2002·380 cites·65 claims
- 0297US5189481AParticle detector for rough surfacesTENCOR INSTRUMENTS·Filed 1991·Granted Feb 23, 1993·276 cites·14 claims
- 0395US5076692AParticle detection on a patterned or bare wafer surfaceTENCOR INSTRUMENTS·Filed 1990·Granted Dec 31, 1991·157 cites·24 claims
- 0490US7623427B2Surface inspection by amplitude modulated specular light detectionSEAGATE TECHNOLOGY LLC·Filed 2007·Granted Nov 24, 2009·36 cites·20 claims
- 0588US5875029AApparatus and method for surface inspection by specular interferometric and diffuse light detectionPHASE METRICS INC·Filed 1997·Granted Feb 23, 1999·115 cites·14 claims
- 0685US6547941B2Ultra high throughput microfluidic analytical systems and methodsCALIPER TECHN CORP·Filed 2001·Granted Apr 15, 2003·39 cites·13 claims
- 0785US5883714AMethod and apparatus for detecting defects on a disk using interferometric analysis on reflected lightPHASE METRICS·Filed 1996·Granted Mar 16, 1999·81 cites·24 claims
- 0882US6881312B2Ultra high throughput microfluidic analytical systems and methodsCALIPER LIFE SCIENCES INC·Filed 2002·Granted Apr 19, 2005·29 cites·15 claims
- 0982US5719840AOptical sensor with an elliptical illumination spotPHASE METRICS·Filed 1996·Granted Feb 17, 1998·39 cites·11 claims
- 1080US5978091ALaser-bump sensor method and apparatusHMT TECHNOLOGY CORP·Filed 1998·Granted Nov 2, 1999·37 cites·20 claims
- 1155US2005135655A1Ultra high throughput microfluidic analytical systems and methodsCALIPER LIFE SCIENCES INC·Filed 2005·Application pending·0 cites
- 1247US7554670B2Surface inspection by double pass laser doppler vibrometrySEAGATE TECHNOLOGY LLC·Filed 2007·Granted Jun 30, 2009·1 cites·18 claims
- 1343US2007247617A1Surface inspection by scattered light detection using dithered illumination spotMAXTOR CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →