Inventor · disambiguated record
Peter Moll
Also filed as: MOLL PETER · MOLL PETER J
18 granted patents·5 pending applications·81 citations·filing 1997–2016
92Inventor score
Files withQIMONDA AG7INFINEON TECHNOLOGIES AG6GLOBALFOUNDRIES INC4AKKUMULATORENFABRICK MOLL GMBH1GLOBAL FOUNDRIES INC1
Top patents by PatentIndex Score
23 records- 0180US7449739B2Storage capacitor for semiconductor memory cells and method of manufacturing a storage capacitorINFINEON TECHNOLOGIES AG·Filed 2006·Granted Nov 11, 2008·9 cites·20 claims
- 0277US7368385B2Method for producing a structure on the surface of a substrateINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 6, 2008·5 cites·18 claims
- 0371US6780337B2Method for trench etchingINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 24, 2004·14 cites·15 claims
- 0467US7615444B2Method for forming a capacitor structureQIMONDA AG·Filed 2006·Granted Nov 10, 2009·4 cites·11 claims
- 0565US7863149B2Method for fabricating a capacitorQIMONDA AG·Filed 2005·Granted Jan 4, 2011·3 cites·21 claims
- 0665US6541372B2Method for manufacturing a conductor structure for an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 1, 2003·10 cites·18 claims
- 0764US6774005B2Method for fabricating a metal carbide layer and method for fabricating a trench capacitor containing a metal carbideINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 10, 2004·9 cites·12 claims
- 0861US7456461B2Stacked capacitor array and fabrication method for a stacked capacitor arrayINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 25, 2008·2 cites·14 claims
- 0959US10115621B2Method for in-die overlay control using FEOL dummy fill layerGLOBALFOUNDRIES INC·Filed 2016·Granted Oct 30, 2018·1 cites·11 claims
- 1056US7544562B2Method for manufacturing a capacitor electrode structureQIMONDA AG·Filed 2006·Granted Jun 9, 2009·1 cites·11 claims
- 1154US8003538B2Method for producing a structure on the surface of a substrateQIMONDA AG·Filed 2008·Granted Aug 23, 2011·0 cites·22 claims
- 1252US7776759B2Methods for forming an integrated circuit, including openings in a mold layer from nanowires or nanotubesQIMONDA AG·Filed 2007·Granted Aug 17, 2010·4 cites·20 claims
- 1348US9196684B2Tensile nitride profile shaper etch to provide void free gapfillGLOBALFOUNDRIES INC·Filed 2014·Granted Nov 24, 2015·0 cites·19 claims
- 1447US9761689B2Method of forming a semiconductor device and according semiconductor deviceGLOBALFOUNDRIES INC·Filed 2014·Granted Sep 12, 2017·0 cites·18 claims
- 1546US9159661B2Integrated circuits with close electrical contacts and methods for fabricating the sameGLOBALFOUNDRIES INC·Filed 2013·Granted Oct 13, 2015·0 cites·16 claims
- 1645US6068945ABatteryAKKUMULATORENFABRICK MOLL GMBH·Filed 1997·Granted May 30, 2000·19 cites·22 claims
- 1743US7687343B2Storage capacitor, a memory device and a method of manufacturing the sameQIMONDA AG·Filed 2006·Granted Mar 30, 2010·0 cites·22 claims
- 1841US2015179740A1Transistor device with strained layerGLOBAL FOUNDRIES INC·Filed 2013·Application pending·0 cites
- 1940US7413951B2Stacked capacitor and method for producing stacked capacitors for dynamic memory cellsQIMONDA AG·Filed 2006·Granted Aug 19, 2008·0 cites·27 claims
- 2039US2007037349A1Method of forming electrodesGUTSCHE MARTIN·Filed 2006·Application pending·0 cites
- 2139US2005056615A1Selective plasma etching process for aluminum oxide patterningFiled 2004·Application pending·0 cites
- 2238US2004063321A1Method for fabricating a semiconductor configurationFiled 2003·Application pending·0 cites
- 2333US2003062562A1Method for fabricating gate oxides in surrounding gate DRAM conceptsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →