Inventor · disambiguated record
Peter W. Neff
Also filed as: NEFF PETER W · NEFF PETER WILLIAM
9 granted patents·4 citations·filing 2014–2022
78Inventor score
Technology areasG01R
Top patents by PatentIndex Score
9 records- 0175US9797928B2Probe card assemblyIBM·Filed 2014·Granted Oct 24, 2017·2 cites·18 claims
- 0272US10041976B2Gimbal assembly test system and methodGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 7, 2018·1 cites·4 claims
- 0368US12248003B2Clustered rigid wafer test probeIBM·Filed 2022·Granted Mar 11, 2025·0 cites·20 claims
- 0468US11085949B2Probe card assemblyIBM·Filed 2019·Granted Aug 10, 2021·0 cites·20 claims
- 0566US11675010B1Compliant wafer probe assemblyIBM·Filed 2021·Granted Jun 13, 2023·0 cites·22 claims
- 0662US10732202B2Repairable rigid test probe card assemblyGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 4, 2020·1 cites·19 claims
- 0761US10578648B2Probe card assemblyIBM·Filed 2017·Granted Mar 3, 2020·0 cites·20 claims
- 0861US10514393B2Gimbal assembly test system and methodGLOBALFOUNDRIES INC·Filed 2018·Granted Dec 24, 2019·0 cites·20 claims
- 0959US11662366B2Wafer probe with elastomer supportIBM·Filed 2021·Granted May 30, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →