Inventor · disambiguated record
Peter Poechmueller
Also filed as: POECHMUELLER PETER
33 granted patents·14 pending applications·400 citations·filing 1997–2023
97Inventor score
Files withINFINEON TECHNOLOGIES AG25POECHMUELLER PETER9SIEMENS AG5INTELLIGENT MEMORY LTD2GRAFE JUERGEN1
Top patents by PatentIndex Score
47 records- 0192US7372749B2Methods for repairing and for operating a memory componentINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·30 cites·20 claims
- 0289US6940773B2Method and system for manufacturing DRAMs with reduced self-refresh current requirementsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 6, 2005·50 cites·18 claims
- 0386US7317248B2Memory module having memory chips protected from excessive heatINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 8, 2008·14 cites·21 claims
- 0486US5859801AFlexible fuse placement in redundant semiconductor memorySIEMENS AG·Filed 1997·Granted Jan 12, 1999·66 cites·22 claims
- 0579US7373562B2Memory circuit comprising redundant memory areasINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·12 cites·21 claims
- 0677US7231488B2Self-refresh system and method for dynamic random access memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 12, 2007·24 cites·19 claims
- 0776US6922338B2Memory module with a heat dissipation meansINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 26, 2005·22 cites·9 claims
- 0875US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0974US7061408B2Concept for a secure data communication between electronic devicesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·21 cites·27 claims
- 1072US12480985B2Multiple tile two-layered motherboard testerINTELLIGENT MEMORY LTD·Filed 2023·Granted Nov 25, 2025·0 cites·11 claims
- 1168US6477081B2Integrated memory having memory cells with a magnetoresistive storage propertyINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 5, 2002·16 cites·6 claims
- 1266US6373286B1Integrated circuit with improved off chip driversSIEMENS AG·Filed 2000·Granted Apr 16, 2002·11 cites·15 claims
- 1364US7359259B2Method for transmission and reception of a data signal on a line pair, as well as a transmission and reception circuit for this purposeINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 15, 2008·2 cites·11 claims
- 1462US7325182B2Method and circuit arrangement for testing electrical modulesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 29, 2008·4 cites·16 claims
- 1561US7134102B2Automated layout transformation system and methodINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 7, 2006·8 cites·12 claims
- 1659US7372750B2Integrated memory circuit and method for repairing a single bit errorINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 13, 2008·4 cites·16 claims
- 1759US7349286B2Memory component and addressing of memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 25, 2008·4 cites·20 claims
- 1858US6522578B2Method for preventing electromigration in an MRAMINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 18, 2003·10 cites·2 claims
- 1958US6504751B2Integrated memory having memory cells with a magnetoresistive storage property and method of operating such a memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 7, 2003·10 cites·11 claims
- 2057US7170798B2Controlled substrate voltage for memory switchesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 30, 2007·9 cites·21 claims
- 2157US5889420AOCD with low output capacitanceSIEMENS AG·Filed 1997·Granted Mar 30, 1999·14 cites·20 claims
- 2257US2025102560A1Multiple tile motherboard testerINTELLIGENT MEMORY LTD·Filed 2023·Application pending·0 cites
- 2354US7298174B2Circuit and method for generating an output signalINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 20, 2007·2 cites·32 claims
- 2453US7248067B2Semiconductor device with test circuit disconnected from power supply connectionINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 24, 2007·5 cites·45 claims
- 2553US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 2649US6947306B2Backside of chip implementation of redundancy fuses and contact padsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 20, 2005·3 cites·19 claims
- 2748US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 2846US6674674B2Method for recognizing and replacing defective memory cells in a memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 6, 2004·4 cites·13 claims
- 2944US2007215988A1Semiconductor Device Including a Plurality of Semiconductor Chips Packaged in a Common HousingQIMONDA AG·Filed 2007·Application pending·0 cites
- 3043US2007085192A1Method for producing micromechanical components in integrated circuits and arrangement of a semiconductor on a substratePOECHMUELLER PETER·Filed 2006·Application pending·0 cites
- 3143US2007090500A1Housed DRAM chip for high-speed applicationsPOECHMUELLER PETER·Filed 2006·Application pending·0 cites
- 3243US2006190674A1Hub chip for connecting one or more memory chipsPOECHMUELLER PETER·Filed 2006·Application pending·0 cites
- 3340US7162382B2Apparatus and method for calibrating signalsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 9, 2007·2 cites·22 claims
- 3440US2006091423A1Layer fill for homogenous technology processingPOECHMUELLER PETER·Filed 2004·Application pending·0 cites
- 3538US6975550B2Array transistor amplification method and apparatus for dynamic random access memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 13, 2005·1 cites·24 claims
- 3638US2005270864A1Memory cell arrangement having dual memory cellsPOECHMUELLER PETER·Filed 2005·Application pending·0 cites
- 3738US2008029884A1Multichip device and method for producing a multichip deviceGRAFE JUERGEN·Filed 2006·Application pending·0 cites
- 3837US6018483ADistributed block redundancy for memory devicesSIEMENS AG·Filed 1998·Granted Jan 25, 2000·6 cites·22 claims
- 3935US2007230082A1Integrated circuit having a plurality of externally fed power supply systemsPOECHMUELLER PETER·Filed 2007·Application pending·0 cites
- 4034US6847571B2Use of redundant memory cells to manufacture cost efficient drams with reduced self refresh current capabilityINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 25, 2005·0 cites·3 claims
- 4134US2006193184A1Hub module for connecting one or more memory chipsPOECHMUELLER PETER·Filed 2006·Application pending·0 cites
- 4234US2006050577A1Memory module with programmable fuse elementPOECHMUELLER PETER·Filed 2005·Application pending·0 cites
- 4334US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 4434US2006203559A1Memory device with customizable configurationPOECHMUELLER PETER·Filed 2005·Application pending·0 cites
- 4531US6137316AIntegrated circuit with improved off chip driversSIEMENS AG·Filed 1998·Granted Oct 24, 2000·3 cites·12 claims
- 4631US2003012066A1Memory and method for replacing defective memory cells in the sameFiled 2002·Application pending·0 cites
- 4730US6711648B1Methods and apparatus for increasing data bandwidth in a dynamic memory device by generating a delayed address transition detection signal in response to a column address strobe signalSIEMENS AG KABUSHIKI KAISHA TO·Filed 1997·Granted Mar 23, 2004·4 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →