Inventor · disambiguated record
Philippe Gastaldo
Also filed as: GASTALDO PHILIPPE
17 granted patents·1 pending application·88 citations·filing 2008–2020
91Inventor score
Files withGASTALDO PHILIPPE4UNITY SEMICONDUCTOR4FOGALE NANOTECH3SAINT AUGUSTIN CANADA ELECTRIC INC3ALTATECH SEMICONDUCTOR2
Top patents by PatentIndex Score
18 records- 0196US9739600B1Chromatic confocal device and method for 2D/3D inspection of an object such as a waferFOGALE NANOTECH·Filed 2016·Granted Aug 22, 2017·33 cites·21 claims
- 0295US9494529B1Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolutionFOGALE NANOTECH·Filed 2016·Granted Nov 15, 2016·22 cites·18 claims
- 0390US10082425B2Integrated chromatic confocal sensorUNITY SEMICONDUCTOR·Filed 2016·Granted Sep 25, 2018·6 cites·12 claims
- 0481US7812942B2Method for detecting surface defects on a substrate and device using said methodSOITEC SILICON ON INSULATOR·Filed 2008·Granted Oct 12, 2010·13 cites·19 claims
- 0578US9857313B2Method and system for inspecting wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Jan 2, 2018·2 cites·13 claims
- 0678US8654324B2Device and method for inspecting semiconductor wafersGASTALDO PHILIPPE·Filed 2010·Granted Feb 18, 2014·5 cites·15 claims
- 0769US10240977B2Method for 2D/3D inspection of an object such as a waferFOGALE NANOTECH·Filed 2016·Granted Mar 26, 2019·1 cites·12 claims
- 0867US8817249B2Device and method for inspecting moving semiconductor wafersGASTALDO PHILIPPE·Filed 2011·Granted Aug 26, 2014·3 cites·14 claims
- 0963US11005418B2Device for testing a concentrated photovoltaic moduleSAINT AUGUSTIN CANADA ELECTRIC INC·Filed 2014·Granted May 11, 2021·0 cites·17 claims
- 1060US10260868B2Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Apr 16, 2019·1 cites·11 claims
- 1158US9007456B2Device and method for inspecting semiconductor wafersGASTALDO PHILIPPE·Filed 2009·Granted Apr 14, 2015·2 cites·17 claims
- 1250US10432140B2Method for testing a concentrated photovoltaic moduleSAINT AUGUSTIN CANADA ELECTRIC INC·Filed 2014·Granted Oct 1, 2019·0 cites·13 claims
- 1347US2009195786A1Device for inspecting semi-conductor wafersGASTALDO PHILIPPE·Filed 2008·Application pending·0 cites
- 1441US11965730B2Method for measuring film thickness distribution of wafer with thin filmsSHINETSU HANDOTAI KK·Filed 2020·Granted Apr 23, 2024·0 cites·8 claims
- 1541US9389189B2Dark-field semiconductor wafer inspection deviceALTATECH SEMICONDUCTOR·Filed 2012·Granted Jul 12, 2016·0 cites·12 claims
- 1638US11092644B2Method and system for inspecting boards for microelectronics or optics by laser doppler effectUNITY SEMICONDUCTOR·Filed 2017·Granted Aug 17, 2021·0 cites·10 claims
- 1735US9859842B2Device and method for testing a concentrated photovoltaic moduleSAINT-AUGUSTIN CANADA ELECTRIC INC·Filed 2014·Granted Jan 2, 2018·0 cites·16 claims
- 1827US9816942B2Device and method for inspecting semiconductor materialsALTATECH SEMICONDUCTOR·Filed 2012·Granted Nov 14, 2017·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →