Inventor · disambiguated record
Phuc Van
Also filed as: VAN PHUC
14 granted patents·137 citations·filing 2000–2009
93Inventor score
Top patents by PatentIndex Score
14 records- 0191US7019513B1Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctionsFAIFER VLADIMIR·Filed 2005·Granted Mar 28, 2006·32 cites·19 claims
- 0279US6546820B1Method and apparatus for multifunction vacuum/nonvacuum annealing systemKOO ANN F·Filed 2000·Granted Apr 15, 2003·19 cites·22 claims
- 0375US6567541B1Method and apparatus for adhesion testing of thin film materialsAHBEE 1 L P·Filed 2000·Granted May 20, 2003·11 cites·22 claims
- 0470US7362088B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2003·Granted Apr 22, 2008·9 cites·11 claims
- 0569US7737680B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·3 cites·3 claims
- 0666US7804294B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsABHEE 1 L P·Filed 2009·Granted Sep 28, 2010·3 cites·1 claims
- 0766US6643393B1Method and apparatus for adhesion testing of thin film materialsFiled 2003·Granted Nov 4, 2003·6 cites·5 claims
- 0864US6922067B1Determination of minority carrier diffusion length in solid state materialsAHBEE 2 L P·Filed 2003·Granted Jul 26, 2005·15 cites·17 claims
- 0964US6611616B1Method and apparatus for adhesion testing of thin film materialsFiled 2003·Granted Aug 26, 2003·5 cites·5 claims
- 1062US7741833B1Non contact method and apparatus for measurement of sheet resistance of p-n junctionsAHBEE 1 L P·Filed 2006·Granted Jun 22, 2010·2 cites·1 claims
- 1159US7502121B1Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materialsAHBEE 1 L P·Filed 2004·Granted Mar 10, 2009·9 cites·4 claims
- 1258US7116429B1Determining thickness of slabs of materials by inventorsWALECKI WOJCIECH J·Filed 2003·Granted Oct 3, 2006·11 cites·11 claims
- 1358USD450000SMultiple environment testing chamberKOO ANN F·Filed 2000·Granted Nov 6, 2001·11 cites·1 claims
- 1457US7737681B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·1 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →