Inventor · disambiguated record
Pieter Jacob Heres
Also filed as: HERES PIETER JACOB
4 granted patents·1 pending application·8 citations·filing 2012–2020
68Inventor score
Top patents by PatentIndex Score
5 records- 0190US10331040B2Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2016·Granted Jun 25, 2019·4 cites·20 claims
- 0289US10620549B2Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2019·Granted Apr 14, 2020·3 cites·20 claims
- 0380US10901326B2Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2020·Granted Jan 26, 2021·1 cites·22 claims
- 0450US12405542B2Method of determining a mark measurement sequence, stage apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2020·Granted Sep 2, 2025·0 cites·28 claims
- 0537US2012218533A1Method of calculating model parameters of a substrate, a lithographic apparatus and an apparatus for controlling lithographic processing by a lithographic apparatusLYULINA IRINA·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →