Inventor · disambiguated record
Ping Fai Yeung
Also filed as: YEUNG PING · YEUNG PING FAI
16 granted patents·596 citations·filing 1997–2016
95Inventor score
Files withMENTOR GRAPHICS CORP6LY TAI AN3LEVITT JEREMY RUTLEDGE2O IN DESIGN AUTOMATION2HO CHIAN-MIN RICHARD1
Top patents by PatentIndex Score
16 records- 0193US6848088B1Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2002·Granted Jan 25, 2005·69 cites·10 claims
- 0292US7454728B2Metastability injector for a circuit descriptionLY TAI AN·Filed 2007·Granted Nov 18, 2008·27 cites·30 claims
- 0391US7243322B1Metastability injector for a circuit descriptionLY TAI AN·Filed 2004·Granted Jul 10, 2007·56 cites·24 claims
- 0490US6885983B1Method for automatically searching for functional defects in a description of a circuitMENTOR GRAPHICS CORP·Filed 2001·Granted Apr 26, 2005·42 cites·68 claims
- 0589US7478028B2Method for automatically searching for functional defects in a description of a circuitHO CHIAN-MIN RICHARD·Filed 2005·Granted Jan 13, 2009·21 cites·18 claims
- 0689US6609229B1Method for automatically generating checkers for finding functional defects in a description of a circuitO IN DESIGN AUTOMATION INC·Filed 2000·Granted Aug 19, 2003·71 cites·122 claims
- 0789US6292765B1Method for automatically searching for functional defects in a description of a circuitO IN DESIGN AUTOMATION·Filed 1997·Granted Sep 18, 2001·67 cites·37 claims
- 0888US6175946B1Method for automatically generating checkers for finding functional defects in a description of a circuitO IN DESIGN AUTOMATION·Filed 1997·Granted Jan 16, 2001·130 cites·20 claims
- 0986US7890897B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2007·Granted Feb 15, 2011·11 cites·23 claims
- 1085US8418121B2Measure of analysis performed in property checkingLEVITT JEREMY RUTLEDGE·Filed 2011·Granted Apr 9, 2013·7 cites·21 claims
- 1185US7454324B1Selection of initial states for formal verificationSEAWRIGHT JAMES ANDREW GARRARD·Filed 2003·Granted Nov 18, 2008·57 cites·18 claims
- 1277US7007249B2Method for automatically generating checkers for finding functional defects in a description of circuitLY TAI AN·Filed 2003·Granted Feb 28, 2006·21 cites·15 claims
- 1375US7318205B2Measure of analysis performed in property checkingLEVITT JEREMY RUTLEDGE·Filed 2004·Granted Jan 8, 2008·15 cites·26 claims
- 1468US9262557B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2013·Granted Feb 16, 2016·1 cites·5 claims
- 1562US9483594B2Reset verificationMENTOR GRAPHICS CORP·Filed 2014·Granted Nov 1, 2016·1 cites·20 claims
- 1657US9684760B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2016·Granted Jun 20, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →