Inventor · disambiguated record
Priyesh Kumar
Also filed as: KUMAR PRIYESH
5 granted patents·2 pending applications·15 citations·filing 2009–2013
73Inventor score
Top patents by PatentIndex Score
7 records- 0182US8566658B2Low-power and area-efficient scan cell for integrated circuit testingTEKUMALLA RAMESH C·Filed 2011·Granted Oct 22, 2013·6 cites·22 claims
- 0277US8812921B2Dynamic clock domain bypass for scan chainsTEKUMALLA RAMESH C·Filed 2011·Granted Aug 19, 2014·4 cites·18 claims
- 0375US8738978B2Efficient wrapper cell design for scan testing of integratedTEKUMALLA RAMESH C·Filed 2011·Granted May 27, 2014·4 cites·20 claims
- 0461US8898527B2At-speed scan testing of clock divider logic in a clock module of an integrated circuitLSI CORP·Filed 2013·Granted Nov 25, 2014·1 cites·20 claims
- 0540US2014201584A1Scan test circuitry comprising at least one scan chain and associated reset multiplexing circuitryLSI CORP·Filed 2013·Application pending·0 cites
- 0638US2013311843A1Scan controller configured to control signal values applied to signal lines of circuit core input interfaceTEKUMALLA RAMESH C·Filed 2012·Application pending·0 cites
- 0737US10025573B2Extensible distribution/update architectureUMAPATHY THANGARAJ·Filed 2009·Granted Jul 17, 2018·0 cites·38 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →