Inventor · disambiguated record
Pradeep Pandey
Also filed as: PANDEY PRADEEP · PANDEY PRADEEP KUMAR
25 granted patents·3 pending applications·799 citations·filing 1994–2017
97Inventor score
Top patents by PatentIndex Score
28 records- 0194US5991525AMethod for real-time nonlinear system state estimation and controlVOYAN TECHNOLOGY·Filed 1997·Granted Nov 23, 1999·186 cites·34 claims
- 0291US6285971B1Method for real-time nonlinear system state estimation and controlVOYAN TECHNOLOGY·Filed 1999·Granted Sep 4, 2001·119 cites·25 claims
- 0389US7452793B2Wafer curvature estimation, monitoring, and compensationTOKYO ELECTRON LTD·Filed 2005·Granted Nov 18, 2008·15 cites·24 claims
- 0488US7025280B2Adaptive real time control of a reticle/mask systemTOKYO ELECTRON LTD·Filed 2004·Granted Apr 11, 2006·41 cites·29 claims
- 0585US7838072B2Method and apparatus for monolayer deposition (MLD)TOKYO ELECTRON LTD·Filed 2005·Granted Nov 23, 2010·7 cites·38 claims
- 0685US7126957B1Media flow method for transferring real-time data between asynchronous and synchronous networksUTSTARCOM INC·Filed 2002·Granted Oct 24, 2006·58 cites·25 claims
- 0785US7101816B2Methods for adaptive real time control of a thermal processing systemTOKYO ELECTRON LTD·Filed 2003·Granted Sep 5, 2006·33 cites·26 claims
- 0885US6803548B2Batch-type heat treatment apparatus and control method for the batch-type heat treatment apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Oct 12, 2004·36 cites·21 claims
- 0985US6289508B1Method and apparatus for dynamic optimizationVOYAN TECHNOLOGY·Filed 2000·Granted Sep 11, 2001·31 cites·61 claims
- 1083US7165011B1Built-in self test for a thermal processing systemTOKYO ELECTRON LTD·Filed 2005·Granted Jan 16, 2007·11 cites·49 claims
- 1181US5517594AThermal reactor optimizationRELMAN INC·Filed 1994·Granted May 14, 1996·81 cites·45 claims
- 1278US6730885B2Batch type heat treatment system, method for controlling same, and heat treatment methodTOKYO ELECTRON LTD·Filed 2001·Granted May 4, 2004·23 cites·17 claims
- 1376US7340377B2Monitoring a single-wafer processing systemTOKYO ELECTRON LTD·Filed 2006·Granted Mar 4, 2008·2 cites·33 claims
- 1475US7459175B2Method for monolayer depositionTOKYO ELECTRON LTD·Filed 2005·Granted Dec 2, 2008·2 cites·34 claims
- 1573US7519885B2Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) tableTOKYO ELECTRON LTD·Filed 2006·Granted Apr 14, 2009·7 cites·49 claims
- 1673US7444572B2Built-in self test for a thermal processing systemTOKYO ELECTRON LTD·Filed 2005·Granted Oct 28, 2008·4 cites·29 claims
- 1773US7406644B2Monitoring a thermal processing systemTOKYO ELECTRON LTD·Filed 2006·Granted Jul 29, 2008·4 cites·25 claims
- 1871US7302363B2Monitoring a system during low-pressure processesTOKYO ELECTRON LTD·Filed 2006·Granted Nov 27, 2007·6 cites·55 claims
- 1969US7526699B2Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) systemTOKYO ELECTRON LTD·Filed 2006·Granted Apr 28, 2009·5 cites·35 claims
- 2066US6167360AMethod and apparatus for dynamic optimizationVOYAN TECHNOLOGY·Filed 1998·Granted Dec 26, 2000·27 cites·16 claims
- 2164US5880959AMethod for computer-aided design of a product or processVOYAN TECHNOLOGY·Filed 1997·Granted Mar 9, 1999·44 cites·32 claims
- 2255US6289255B1Method for computer-aided design of a product or processVOYAN TECHNOLOGY·Filed 1998·Granted Sep 11, 2001·20 cites·43 claims
- 2355US6195594B1Real-time planner for designVOYAN TECHNOLOGY·Filed 1999·Granted Feb 27, 2001·20 cites·70 claims
- 2447US2017043561A1Direct contact heat sealed polyethylene laminatesPROCTER & GAMBLE·Filed 2016·Application pending·0 cites
- 2543US6041172AMultiple scale signal processing and control systemVOYAN TECHNOLOGY·Filed 1997·Granted Mar 21, 2000·9 cites·28 claims
- 2640US6452291B1Reduction of switching transients via large signal/small signal thresholdingVOYAN TECHNOLOGY·Filed 1999·Granted Sep 17, 2002·8 cites·37 claims
- 2737US2015307264A1Bag made from a foamed film laminatePROCTER & GAMBLE·Filed 2015·Application pending·0 cites
- 2831US2019016753A1Methods for separating isoforms of monoclonal antibodiesONCOBIOLOGICS INC·Filed 2017·Application pending·0 cites
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