Inventor · disambiguated record
Praveen Parvathala
Also filed as: PARVATHALA PRAVEEN · PARVATHALA PRAVEEN K
7 granted patents·1 pending application·174 citations·filing 1996–2005
87Inventor score
Files withINTEL CORP8
Top patents by PatentIndex Score
8 records- 0181US6928638B2Tool for generating a re-generative functional testINTEL CORP·Filed 2001·Granted Aug 9, 2005·46 cites·31 claims
- 0277US5968194AMethod for application of weighted random patterns to partial scan designsINTEL CORP·Filed 1997·Granted Oct 19, 1999·49 cites·10 claims
- 0376US6948096B2Functional random instruction testing (FRIT) method for complex devices such as microprocessorsINTEL CORP·Filed 2001·Granted Sep 20, 2005·24 cites·20 claims
- 0465US6032278AMethod and apparatus for performing scan testingINTEL CORP·Filed 1996·Granted Feb 29, 2000·26 cites·13 claims
- 0561US6990621B2Enabling at speed application of test patterns associated with a wide tester interface on a low pin count testerINTEL CORP·Filed 2002·Granted Jan 24, 2006·8 cites·18 claims
- 0650US5978944AMethod and apparatus for scan testing dynamic circuitsINTEL CORP·Filed 1997·Granted Nov 2, 1999·15 cites·12 claims
- 0741US2005262410A1Tool for generating a re-generative functional testINTEL CORP·Filed 2005·Application pending·0 cites
- 0836US5872795AMethod and apparatus for scan testing of multi-phase logicINTEL CORP·Filed 1997·Granted Feb 16, 1999·6 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →