Inventor · disambiguated record
Purnendu K. Mozumder
Also filed as: MOZUMDER PURNENDU · MOZUMDER PURNENDU K · MOZUMDER PURNENDU KANTI
22 granted patents·1,708 citations·filing 1993–2008
97Inventor score
Top patents by PatentIndex Score
22 records- 0197US6901564B2System and method for product yield predictionPDF SOLUTIONS INC·Filed 2002·Granted May 31, 2005·143 cites·45 claims
- 0295US7174521B2System and method for product yield predictionPDF SOLUTIONS INC·Filed 2005·Granted Feb 6, 2007·32 cites·36 claims
- 0394US5402367AApparatus and method for model based process controlTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 28, 1995·164 cites·19 claims
- 0493US5526293ASystem and method for controlling semiconductor wafer processingTEXAS INSTRUMENTS INC·Filed 1993·Granted Jun 11, 1996·198 cites·20 claims
- 0593US5408405AMulti-variable statistical process controller for discrete manufacturingTEXAS INSTRUMENTS INC·Filed 1993·Granted Apr 18, 1995·253 cites·20 claims
- 0692US7356800B2System and method for product yield predictionPDF SOLUTIONS INC·Filed 2006·Granted Apr 8, 2008·15 cites·20 claims
- 0791US7673262B2System and method for product yield predictionPDF SOLUTIONS INC·Filed 2008·Granted Mar 2, 2010·11 cites·20 claims
- 0891US7373625B2System and method for product yield predictionPDF SOLUTIONS INC·Filed 2006·Granted May 13, 2008·12 cites·29 claims
- 0989US5661669AMethod for controlling semiconductor wafer processingTEXAS INSTRUMENTS INC·Filed 1995·Granted Aug 26, 1997·146 cites·33 claims
- 1089US5546312AUse of spatial models for simultaneous control of various non-uniformity metricsTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 13, 1996·97 cites·17 claims
- 1185US5838595AApparatus and method for model based process controlTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 17, 1998·98 cites·20 claims
- 1285US5751582AControlling process modules using site models and monitor wafer controlTEXAS INSTRUMENTS INC·Filed 1996·Granted May 12, 1998·97 cites·21 claims
- 1383US6381564B1Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulatorsTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 30, 2002·112 cites·20 claims
- 1475US5901062ASemiconductor structure design and process visualization through the use of simple process models and intuitive interfacesTEXAS INSTRUMENTS INC·Filed 1996·Granted May 4, 1999·71 cites·15 claims
- 1565US6157062AIntegrating dual supply voltage by removing the drain extender implant from the high voltage deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Dec 5, 2000·25 cites·14 claims
- 1663US5912678AProcess flow design at the module effects level through the use of acceptability regionsTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 15, 1999·149 cites·13 claims
- 1750US6388288B1Integrating dual supply voltages using a single extra mask levelTEXAS INSTRUMENTS INC·Filed 1999·Granted May 14, 2002·13 cites·18 claims
- 1844US6311096B1Design of microelectronic process flows for manufacturability and performanceTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 30, 2001·46 cites·12 claims
- 1941US6317640B1System and method for non-parametric modeling of processed induced variabilityTEXAS INSTRUMENTS INC·Filed 1999·Granted Nov 13, 2001·14 cites·7 claims
- 2037US6438439B1Equipment evaluation and designTEXAS INSTRUMENTS INC·Filed 1998·Granted Aug 20, 2002·6 cites·4 claims
- 2136US5822241ADRAM pass transistorsTEXAS INSTRUMENTS INC·Filed 1997·Granted Oct 13, 1998·4 cites·2 claims
- 2232US5548548APass transistor for a 256 megabit dram with negatively biased substrateTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 20, 1996·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →