Inventor · disambiguated record
Qing Su
Also filed as: SU QING
19 granted patents·333 citations·filing 2004–2021
94Inventor score
Top patents by PatentIndex Score
19 records- 0197US8264065B2ESD/antenna diodes for through-silicon viasSU QING·Filed 2009·Granted Sep 11, 2012·242 cites·33 claims
- 0285US11531797B1Vector generation for maximum instantaneous peak powerSYNOPSYS INC·Filed 2021·Granted Dec 20, 2022·3 cites·19 claims
- 0384US8762918B2Banded computation architecturesSYNOPSYS INC·Filed 2013·Granted Jun 24, 2014·7 cites·19 claims
- 0483US8151236B2Steiner tree based approach for polygon fracturingSU QING·Filed 2008·Granted Apr 3, 2012·8 cites·38 claims
- 0582US7346865B2Fast evaluation of average critical area for IC layoutsSYNOPSYS INC·Filed 2004·Granted Mar 18, 2008·23 cites·27 claims
- 0680US7707526B2Predicting IC manufacturing yield based on hotspotsSYNOPSYS INC·Filed 2007·Granted Apr 27, 2010·11 cites·31 claims
- 0778US7289933B2Simulating topography of a conductive material in a semiconductor waferSYNOPSYS INC·Filed 2005·Granted Oct 30, 2007·10 cites·36 claims
- 0876US7543255B2Method and apparatus to reduce random yield lossSYNOPSYS INC·Filed 2007·Granted Jun 2, 2009·8 cites·13 claims
- 0974US7679872B2Electrostatic-discharge protection using a micro-electromechanical-system switchSYNOPSYS INC·Filed 2008·Granted Mar 16, 2010·7 cites·22 claims
- 1069US8458635B2Convolution computation for many-core processor architecturesNI MIN·Filed 2009·Granted Jun 4, 2013·4 cites·21 claims
- 1167US7962873B2Fast evaluation of average critical area for ic layoutsSYNOPSYS INC·Filed 2008·Granted Jun 14, 2011·2 cites·15 claims
- 1266US8000826B2Predicting IC manufacturing yield by considering both systematic and random intra-die process variationsSYNOPSYS INC·Filed 2006·Granted Aug 16, 2011·4 cites·18 claims
- 1364US8999766B2ESD/antenna diodes for through-silicon viasSYNOPSYS INC·Filed 2013·Granted Apr 7, 2015·1 cites·24 claims
- 1461US8205185B2Fast evaluation of average critical area for IC layoutsSU QING·Filed 2009·Granted Jun 19, 2012·1 cites·14 claims
- 1561US8205179B2Fast evaluation of average critical area for IC layoutsSU QING·Filed 2009·Granted Jun 19, 2012·1 cites·21 claims
- 1661US7962882B2Fast evaluation of average critical area for IC layoutsSYNOPSYS INC·Filed 2008·Granted Jun 14, 2011·1 cites·14 claims
- 1752US8877638B2ESD/antenna diodes for through-silicon viasKAWA JAMIL·Filed 2012·Granted Nov 4, 2014·0 cites·15 claims
- 1849US11651131B2Glitch source identification and rankingSYNOPSYS INC·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 1945US12001768B1Enhanced glitch estimation in vectorless power analysisSYNOPSYS INC·Filed 2021·Granted Jun 4, 2024·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →