Inventor · disambiguated record
R. Warren Necoechea
Also filed as: NECOECHEA R WARREN
11 granted patents·175 citations·filing 1983–2011
91Inventor score
Top patents by PatentIndex Score
11 records- 0178US6703825B1Separating device response signals from composite signalsLTX CORP·Filed 2003·Granted Mar 9, 2004·19 cites·17 claims
- 0278US5191295APhase shift vernier for automatic test systemsLTX CORP·Filed 1992·Granted Mar 2, 1993·45 cites·11 claims
- 0374US6563298B1Separating device response signals from composite signalsLTX CORP·Filed 2000·Granted May 13, 2003·16 cites·25 claims
- 0472US8269480B2Method and apparatus for identifying and reducing spurious frequency componentsMAX SOLOMON·Filed 2008·Granted Sep 18, 2012·6 cites·12 claims
- 0572US5311486ATiming generation in an automatic electrical test systemLTX CORP·Filed 1992·Granted May 10, 1994·27 cites·27 claims
- 0672US4572971ATri-state driver circuit for automatic test equipmentFAIRCHILD CAMERA INSTR CO·Filed 1984·Granted Feb 25, 1986·25 cites·22 claims
- 0768US6560756B1Method and apparatus for distributed test pattern decompressionLTX CORP·Filed 2001·Granted May 6, 2003·17 cites·44 claims
- 0861US7849374B1Testing a transceiverLTX CORP·Filed 2006·Granted Dec 7, 2010·4 cites·19 claims
- 0952US4594544AParticipate register for parallel loading pin-oriented registers in test equipmentFAIRCHILD CAMERA INSTR CO·Filed 1983·Granted Jun 10, 1986·15 cites·11 claims
- 1047US8415941B2Method and apparatus for identifying and reducing spurious frequency componentsMAX SOLOMON·Filed 2011·Granted Apr 9, 2013·0 cites·24 claims
- 1130US4647796AMultiple level voltage comparator circuitFAIRCHILD SEMICONDUCTOR·Filed 1983·Granted Mar 3, 1987·1 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →