Inventor · disambiguated record
Ralf Arnold
Also filed as: ARNOLD RALF
20 granted patents·2 pending applications·170 citations·filing 1997–2023
94Inventor score
Files withINFINEON TECHNOLOGIES AG12ARNOLD RALF2ZEISS CARL SMT AG2ZEISS CARL SMT GMBH2BRODBECK MASCHB GMBH1
Top patents by PatentIndex Score
22 records- 0196US7605926B1Optical system, method of manufacturing an optical system and method of manufacturing an optical elementZEISS CARL SMT AG·Filed 2008·Granted Oct 20, 2009·47 cites·6 claims
- 0291US7936521B2Method of measuring a deviation of an optical surface from a target shapeZEISS CARL SMT GMBH·Filed 2010·Granted May 3, 2011·9 cites·13 claims
- 0382US7139127B2Diffractive optical elementZEISS CARL AG·Filed 2005·Granted Nov 21, 2006·12 cites·41 claims
- 0478US6996709B2Method for configuring a configurable hardware block by configuring configurable connections provided around a given type of subunitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 7, 2006·33 cites·20 claims
- 0577US8853642B2Beam regulating apparatus for an EUV illumination beamZEISS CARL SMT GMBH·Filed 2013·Granted Oct 7, 2014·2 cites·20 claims
- 0677US7453282B2Input and output circuit of an integrated circuit and a method for testing the sameINFINEON TECHNOLOGIES AG·Filed 2006·Granted Nov 18, 2008·10 cites·13 claims
- 0770US8508749B2Method of measuring a deviation of an optical surface from a target shape using interferometric measurement resultsARNOLD RALF·Filed 2012·Granted Aug 13, 2013·2 cites·18 claims
- 0869US8264695B2Method of measuring a deviation of an optical surface from a target shapeARNOLD RALF·Filed 2011·Granted Sep 11, 2012·2 cites·17 claims
- 0963US7640469B2Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic elementINFINEON TECHNOLOGIES AG·Filed 2006·Granted Dec 29, 2009·4 cites·21 claims
- 1063US7331005B2Semiconductor circuit device and a system for testing a semiconductor apparatusINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·4 cites·23 claims
- 1161US7728987B2Method of manufacturing an optical elementZEISS CARL SMT AG·Filed 2004·Granted Jun 1, 2010·10 cites·18 claims
- 1260US7028162B2Configurable processing block capable of interacting with external hardwareSIEMENS AG·Filed 2001·Granted Apr 11, 2006·9 cites·25 claims
- 1350US7355414B2Test apparatus with low-reflection signal distributionINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 8, 2008·2 cites·24 claims
- 1449US2025076355A1Contact resistance measurement methodINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 1547US6885963B2Method for testing a program-controlled unit by an external test deviceINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 26, 2005·3 cites·26 claims
- 1646US8860592B2Signal generating circuitINFINEON TECHNOLOGIES AG·Filed 2013·Granted Oct 14, 2014·1 cites·7 claims
- 1746US6101910AApparatus for cutting tubesBRODBECK MASCHB GMBH·Filed 1997·Granted Aug 15, 2000·14 cites·24 claims
- 1844US7386776B2System for testing digital componentsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 10, 2008·4 cites·43 claims
- 1940US7308628B2Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Dec 11, 2007·2 cites·9 claims
- 2039US11555844B2High accurate contact resistance measurement method using one or more diodesINFINEON TECHNOLOGIES AG·Filed 2018·Granted Jan 17, 2023·0 cites·22 claims
- 2139US11351868B2Electrical traction drive for a vehicleZIEHL ABEGG AUTOMOTIVE GMBH & CO KG·Filed 2017·Granted Jun 7, 2022·0 cites·21 claims
- 2236US2014098847A1Test circuitINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →