Inventor · disambiguated record
Raheel Azmat
Also filed as: AZMAT RAHEEL
23 granted patents·5 pending applications·102 citations·filing 2014–2024
94Inventor score
Top patents by PatentIndex Score
28 records- 0195US10720429B2Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 21, 2020·8 cites·19 claims
- 0295US10297596B2Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 21, 2019·10 cites·18 claims
- 0394US11348918B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted May 31, 2022·4 cites·15 claims
- 0494US9741661B2Logic semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 22, 2017·13 cites·19 claims
- 0593US9418990B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 16, 2016·11 cites·19 claims
- 0692US10361198B2Integrated circuit devices and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 23, 2019·11 cites·8 claims
- 0791US9324715B2Flip-flop layout architecture implementation for semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 26, 2016·16 cites·20 claims
- 0887US11223344B2Scan flip-flop, flip-flop and scan test circuit including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 11, 2022·2 cites·20 claims
- 0985US10903213B2Integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jan 26, 2021·4 cites·17 claims
- 1084US9748238B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 29, 2017·4 cites·20 claims
- 1182US10224331B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 5, 2019·3 cites·19 claims
- 1280US9443851B2Semiconductor devices including finFETs and local interconnect layers and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 13, 2016·5 cites·18 claims
- 1379US11461521B2Integrated circuit including standard cell and method of fabricating the integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 4, 2022·2 cites·10 claims
- 1478US9659871B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted May 23, 2017·4 cites·10 claims
- 1577US9947661B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 17, 2018·2 cites·20 claims
- 1673US10002860B2Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jun 19, 2018·2 cites·14 claims
- 1772US11316032B2Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 26, 2022·0 cites·18 claims
- 1872US11282836B2Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1971US10170421B2Logic semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jan 1, 2019·1 cites·18 claims
- 2070US11868691B2Integrated circuit including standard cell and method of fabricating the integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jan 9, 2024·0 cites·20 claims
- 2166US11688740B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 27, 2023·0 cites·19 claims
- 2260US2025374670A1Track stealing for standard cell height compactionQUALCOMM INC·Filed 2024·Application pending·0 cites
- 2355US2024332278A1Routability improvement for an ultra-high dense standard cell architectureQUALCOMM INC·Filed 2023·Application pending·0 cites
- 2454US2017033101A1Integrated circuit and standard cell librarySAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
- 2549US2023068716A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2648US9929180B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 27, 2018·0 cites·17 claims
- 2747US2017053917A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
- 2845US11631672B2Semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 18, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →