Inventor · disambiguated record
Rajit Chandra
Also filed as: CHANDRA RAJIT · CHANDRA RAJIT C
22 granted patents·10 pending applications·540 citations·filing 2000–2017
96Inventor score
Files withGRADIENT DESIGN AUTOMATION INC12QUALCOMM INC8CHANDRA RAJIT6ADVANCED MICRO DEVICES INC2LI PENG1
Top patents by PatentIndex Score
32 records- 0195US7823102B2Thermally aware design modificationGRADIENT DESIGN AUTOMATION INC·Filed 2008·Granted Oct 26, 2010·51 cites·44 claims
- 0294US9323870B2Method and apparatus for improved integrated circuit temperature evaluation and IC designADVANCED MICRO DEVICES INC·Filed 2013·Granted Apr 26, 2016·20 cites·12 claims
- 0394US7472363B1Semiconductor chip design having thermal awareness across multiple sub-system domainsGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Dec 30, 2008·44 cites·77 claims
- 0493US7191413B2Method and apparatus for thermal testing of semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Mar 13, 2007·31 cites·11 claims
- 0591US8019580B1Transient thermal analysisGRADIENT DESIGN AUTOMATION INC·Filed 2008·Granted Sep 13, 2011·35 cites·10 claims
- 0691US7401304B2Method and apparatus for thermal modeling and analysis of semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Jul 15, 2008·31 cites·39 claims
- 0791US7383520B2Method and apparatus for optimizing thermal management system performance using full-chip thermal analysis of semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Jun 3, 2008·26 cites·29 claims
- 0891US7203920B2Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilitiesGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Apr 10, 2007·25 cites·16 claims
- 0990US8286111B2Thermal simulation using adaptive 3D and hierarchical grid mechanismsCHANDRA RAJIT·Filed 2008·Granted Oct 9, 2012·50 cites·38 claims
- 1090US6591402B1System and method for performing assertion-based analysis of circuit designsMOSCAPE INC·Filed 2000·Granted Jul 8, 2003·154 cites·81 claims
- 1189US10309838B2Temporal temperature sensor position offset error correctionQUALCOMM INC·Filed 2016·Granted Jun 4, 2019·5 cites·18 claims
- 1285US7353471B1Method and apparatus for using full-chip thermal analysis of semiconductor chip designs to compute thermal conductanceGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Apr 1, 2008·13 cites·16 claims
- 1384US7194711B2Method and apparatus for full-chip thermal analysis of semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2004·Granted Mar 20, 2007·33 cites·29 claims
- 1475US10416737B2Thermal mitigation based on predicted temperaturesQUALCOMM INC·Filed 2014·Granted Sep 17, 2019·3 cites·30 claims
- 1575US9582052B2Thermal mitigation of multi-core processorQUALCOMM INC·Filed 2015·Granted Feb 28, 2017·2 cites·28 claims
- 1675US8082137B2Method and apparatus for thermal modeling and analysis of semiconductor chip designsLI PENG·Filed 2008·Granted Dec 20, 2011·6 cites·27 claims
- 1770US7587692B2Method and apparatus for full-chip thermal analysis of semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2007·Granted Sep 8, 2009·4 cites·21 claims
- 1868US7458052B1Method and apparatus for normalizing thermal gradients over semiconductor chip designsGRADIENT DESIGN AUTOMATION INC·Filed 2005·Granted Nov 25, 2008·4 cites·17 claims
- 1967US10114443B2Thermal mitigation of multi-core processorQUALCOMM INC·Filed 2017·Granted Oct 30, 2018·1 cites·28 claims
- 2064US9557797B2Algorithm for preferred core sequencing to maximize performance and reduce chip temperature and powerQUALCOMM INC·Filed 2014·Granted Jan 31, 2017·1 cites·29 claims
- 2159US7590958B2Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilitiesGRADIENT DESIGN AUTOMATION INC·Filed 2007·Granted Sep 15, 2009·1 cites·29 claims
- 2254US10591531B2Method and apparatus for integrated circuit monitoring and prevention of electromigration failureQUALCOMM INC·Filed 2016·Granted Mar 17, 2020·0 cites·24 claims
- 2349US2008141192A1Method and apparatus for using full-chip thermal analysis of semiconductor chip designs to compute thermal conductanceCHANDRA RAJIT·Filed 2008·Application pending·0 cites
- 2449US2008163135A1Method and apparatus for optimizing thermal management system performance using full-chip thermal analysis of semiconductor chip designsCHANDRA RAJIT·Filed 2008·Application pending·0 cites
- 2548US2009044156A1Method and apparatus for normalizing thermal gradients over semiconductor chip designsCHANDRA RAJIT·Filed 2008·Application pending·0 cites
- 2648US2016139589A1Thermal mitigation based on event counterQUALCOMM INC·Filed 2014·Application pending·0 cites
- 2741US2009224356A1Method and apparatus for thermally aware design improvementCHANDRA RAJIT·Filed 2005·Application pending·0 cites
- 2841US2009048801A1Method and apparatus for generating thermal test vectorsCHANDRA RAJIT·Filed 2005·Application pending·0 cites
- 2940US2018143853A1Circuits and Methods Providing Core Scheduling in Response to Aging for a Multi-Core ProcessorQUALCOMM INC·Filed 2017·Application pending·0 cites
- 3039US2009077508A1Accelerated life testing of semiconductor chipsRUBIN DANIEL I·Filed 2008·Application pending·0 cites
- 3135US2014181780A1Electromigration analysis for standard cell based designsADVANCED MICRO DEVICES INC·Filed 2012·Application pending·0 cites
- 3233US2003145296A1Formal automated methodology for optimal signal integrity characterization of cell librariesFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →