Inventor · disambiguated record
Rainer Fettig
Also filed as: FETTIG RAINER
2 granted patents·1 pending application·2 citations·filing 2017–2024
34Inventor score
Top patents by PatentIndex Score
3 records- 0178US9995764B2Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2017·Granted Jun 12, 2018·2 cites·24 claims
- 0252US2024186109A1Method and apparatus for repairing a defect of a sample using a focused particle beamZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0332US11961705B2Method and apparatus for examining a beam of charged particlesHoinkis Elke·Filed 2020·Granted Apr 16, 2024·0 cites·39 claims
Join the waitlist — get patent alerts
Get an alert when Rainer Fettig files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →