Inventor · disambiguated record
Randall S. Geels
Also filed as: GEELS RANDALL S
18 granted patents·6 pending applications·573 citations·filing 1995–2017
95Inventor score
Top patents by PatentIndex Score
24 records- 0195US6172756B1Rapid and accurate end point detection in a noisy environmentFILMETRICS INC·Filed 1998·Granted Jan 9, 2001·188 cites·15 claims
- 0294US7151609B2Determining wafer orientation in spectral imagingFILMETRICS INC·Filed 2006·Granted Dec 19, 2006·30 cites·37 claims
- 0384US6148013AVisible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beamSDL INC·Filed 1999·Granted Nov 14, 2000·41 cites·20 claims
- 0482US6184985B1Spectrometer configured to provide simultaneous multiple intensity spectra from independent light sourcesFILMETRICS INC·Filed 1998·Granted Feb 6, 2001·68 cites·20 claims
- 0581US6181721B1Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beamSDL INC·Filed 1996·Granted Jan 30, 2001·39 cites·10 claims
- 0678US6307873B1Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beamJDS UNIPHASE CORP·Filed 1999·Granted Oct 23, 2001·29 cites·12 claims
- 0777US7502119B2Thin-film metrology using spectral reflectance with an intermediate in-line referenceFILMETRICS INC·Filed 2007·Granted Mar 10, 2009·5 cites·26 claims
- 0877US6272162B1Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beamSDL INC·Filed 2000·Granted Aug 7, 2001·9 cites·7 claims
- 0977US5850411ATransverse electric (TE) polarization mode AlGaInP/GaAs red laser diodes, especially with self-pulsating operationSDL INC·Filed 1996·Granted Dec 15, 1998·42 cites·30 claims
- 1076US7095511B2Method and apparatus for high-speed thickness mapping of patterned thin filmsFILMETRICS INC·Filed 2001·Granted Aug 22, 2006·21 cites·17 claims
- 1166US5933705APassivation and protection of semiconductor surfaceSDL INC·Filed 1997·Granted Aug 3, 1999·31 cites·26 claims
- 1266US5799028APassivation and protection of a semiconductor surfaceSDL INC·Filed 1996·Granted Aug 25, 1998·31 cites·23 claims
- 1362US8908177B2Correction of second-order diffraction effects in fiber-optic-based spectrometersFILMETRICS INC·Filed 2013·Granted Dec 9, 2014·1 cites·31 claims
- 1460US6148014AVisible wavelength semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beamSDL INC·Filed 1999·Granted Nov 14, 2000·15 cites·10 claims
- 1553US5654229AMethod for replicating periodic nonlinear coefficient patterning during and after growth of epitaxial ferroelectric oxide filmsXEROX CORP·Filed 1995·Granted Aug 5, 1997·19 cites·48 claims
- 1646US10240981B2Optical spectrometer configuration including spatially variable filter (SVF)ROSS MATTHEW F·Filed 2016·Granted Mar 26, 2019·0 cites·63 claims
- 1740US11099068B2Optical instrumentation including a spatially variable filterFILMETRICS INC·Filed 2017·Granted Aug 24, 2021·0 cites·45 claims
- 1840US2005174584A1Method and apparatus for high-speed thickness mapping of patterned thin filmsFiled 2005·Application pending·0 cites
- 1939US2006166608A1Spectral imaging of substratesCHALMERS SCOTT A·Filed 2005·Application pending·0 cites
- 2038US2004259472A1Whole-substrate spectral imaging system for CMPFiled 2004·Application pending·0 cites
- 2137US2005174583A1Method and apparatus for high-speed thickness mapping of patterned thin filmsFiled 2005·Application pending·0 cites
- 2237US2018252518A1Optical profilometerCHALMERS SCOTT A·Filed 2017·Application pending·0 cites
- 2335US2017314914A1Optical profilometerCHALMERS SCOTT A·Filed 2017·Application pending·0 cites
- 2432USRE36802ETransverse electric (TE) polarization mode AlGaInP/GaAs red laser diodes, especially with self-pulsating operationSDL INC·Filed 1999·Granted Aug 1, 2000·4 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →