Inventor · disambiguated record

Radek Jancík

Also filed as: JANCÍK RADEK

0 granted patents·3 pending applications·0 citations·filing 2024–2024

Technology areasG06N

Files withFEI CO3

Top patents by PatentIndex Score

3 records

0175US2025348669A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
0275US2025348670A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
0374US2025348668A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →