Inventor · disambiguated record
Rajesh Khurana
Also filed as: KHURANA RAJESH
6 granted patents·30 citations·filing 2009–2023
79Inventor score
Top patents by PatentIndex Score
6 records- 0193US12055586B13D stacked die testing structureCADENCE DESIGN SYSTEMS INC·Filed 2023·Granted Aug 6, 2024·2 cites·20 claims
- 0290US11379644B1IC chip test engineCADENCE DESIGN SYSTEMS INC·Filed 2020·Granted Jul 5, 2022·3 cites·20 claims
- 0387US9170301B1Hierarchical compaction for test pattern power generationCADENCE DESIGN SYSTEMS INC·Filed 2013·Granted Oct 27, 2015·8 cites·30 claims
- 0485US10528689B1Verification process for IJTAG based test pattern migrationCADENCE DESIGN SYSTEMS INC·Filed 2016·Granted Jan 7, 2020·7 cites·20 claims
- 0572US8615692B1Method and system for analyzing test vectors to determine toggle countsKHURANA RAJESH·Filed 2009·Granted Dec 24, 2013·8 cites·30 claims
- 0669US10796041B1Compacting test patterns for IJTAG testCADENCE DESIGN SYSTEMS INC·Filed 2019·Granted Oct 6, 2020·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →