Inventor · disambiguated record
Radhakrishna Kotti
Also filed as: KOTTI RADHAKRISHNA
13 granted patents·4 pending applications·4 citations·filing 2019–2024
85Inventor score
Files withMICRON TECHNOLOGY INC17
Top patents by PatentIndex Score
17 records- 0182US12438083B2Assemblies having conductive interconnects which are laterally and vertically offset relative to one anotherMICRON TECHNOLOGY INC·Filed 2024·Granted Oct 7, 2025·0 cites·12 claims
- 0281US11515204B2Methods for forming conductive vias, and associated devices and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 29, 2022·1 cites·25 claims
- 0380US12387981B2Methods for forming conductive vias, and associated devices and systemsMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 0477US11302589B2Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2019·Granted Apr 12, 2022·2 cites·12 claims
- 0575US12014983B2Assemblies having conductive interconnects which are laterally and vertically offset relative to one another and methods of forming assemblies having conductive interconnects which are laterally and vertically offset relative to one anotherMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 18, 2024·0 cites·9 claims
- 0674US11990370B2Methods for forming conductive vias, and associated devices and systemsMICRON TECHNOLOGY INC·Filed 2022·Granted May 21, 2024·0 cites·20 claims
- 0774US11222695B2Socket design for a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 11, 2022·1 cites·29 claims
- 0873US11961556B2Socket design for a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 16, 2024·0 cites·17 claims
- 0973US2024355685A1Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1070US11996336B2Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2022·Granted May 28, 2024·0 cites·18 claims
- 1167US11482492B2Assemblies having conductive interconnects which are laterally and vertically offset relative to one anotherMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 25, 2022·0 cites·29 claims
- 1266US11636911B2Leakage source detection for memory with varying conductive path lengthsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 25, 2023·0 cites·20 claims
- 1365US2023163030A1Methods for forming conductive vias, and associated devices and systemsMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 1464US11574842B2Methods for forming conductive vias, and associated devices and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 7, 2023·0 cites·14 claims
- 1558US11081203B2Leakage source detection by scanning access linesMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 3, 2021·0 cites·19 claims
- 1650US2023298951A1Test structures for a wafer, and associated devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 1747US2023290684A1Structures and methods for dicing semiconductor devicesMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →