Inventor · disambiguated record
Raimondo P. Sessego
Also filed as: SESSEGO RAIMONDO · SESSEGO RAIMONDO P
12 granted patents·1 pending application·74 citations·filing 1997–2017
87Inventor score
Files withFREESCALE SEMICONDUCTOR INC5DAR TEHMOOR M2SESSEGO RAIMONDO P2DEBEURRE BRUNO1LUCENT TECHNOLOGIES INC1
Top patents by PatentIndex Score
13 records- 0181US9834438B2Compensation and calibration for MEMS devicesDAR TEHMOOR M·Filed 2015·Granted Dec 5, 2017·3 cites·19 claims
- 0281US9475689B2MEMS parameter identification using modulated waveformsFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Oct 25, 2016·2 cites·20 claims
- 0375US9335396B2MCU-based compensation and calibration for MEMS devicesDEBEURRE BRUNO·Filed 2013·Granted May 10, 2016·5 cites·20 claims
- 0475US5805667AApparatus for range-testing cordless communication devices and method of operation thereofLUCENT TECHNOLOGIES INC·Filed 1997·Granted Sep 8, 1998·57 cites·20 claims
- 0569US9365413B2Transducer-including devices, and methods and apparatus for their calibrationFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Jun 14, 2016·3 cites·21 claims
- 0667US9221679B2Compensation and calibration for MEMS devicesDAR TEHMOOR M·Filed 2014·Granted Dec 29, 2015·2 cites·20 claims
- 0765US9527731B2Methodology and system for wafer-level testing of MEMS pressure sensorsFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Dec 27, 2016·1 cites·16 claims
- 0857US10012673B2Compensation and calibration of multiple mass MEMS sensorNXP USA INC·Filed 2017·Granted Jul 3, 2018·0 cites·7 claims
- 0954US9797921B2Compensation and calibration of multiple mass MEMS sensorFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Oct 24, 2017·0 cites·9 claims
- 1049US9400226B2Methods and apparatus for calibrating transducer-including devicesSESSEGO RAIMONDO P·Filed 2013·Granted Jul 26, 2016·1 cites·20 claims
- 1149US9335340B2MEMS parameter identification using modulated waveformsSESSEGO RAIMONDO P·Filed 2013·Granted May 10, 2016·0 cites·20 claims
- 1243US2016116361A1System for wafer-level testing of mems pressure sensorsFREESCALE SEMICONDUCTOR INC·Filed 2014·Application pending·0 cites
- 1330US8878527B2Magnetic field simulator for testing singulated or multi-site strip semiconductor device and method thereforSESSEGO RAIMONDO·Filed 2010·Granted Nov 4, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →