Inventor · disambiguated record
Ran Yacoby
Also filed as: YACOBY RAN
5 granted patents·4 pending applications·0 citations·filing 2021–2025
60Inventor score
Top patents by PatentIndex Score
9 records- 0176US12321102B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2023·Granted Jun 3, 2025·0 cites·18 claims
- 0276US2025334887A1Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2025·Application pending·0 cites
- 0368US2024069445A1Self-supervised representation learning for interpretation of ocd dataNOVA LTD·Filed 2023·Application pending·0 cites
- 0465US11815819B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2021·Granted Nov 14, 2023·0 cites·17 claims
- 0558US11747740B2Self-supervised representation learning for interpretation of OCD dataNOVA LTD·Filed 2021·Granted Sep 5, 2023·0 cites·14 claims
- 0647US12469124B2Machine learning based yield predictionAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 0747US2024289940A1Optimal determination of an overlay target using machine learningAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0844US2024428396A1Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0942US11874606B2System and method for controlling measurements of sample's parametersNOVA LTD·Filed 2021·Granted Jan 16, 2024·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →