Inventor · disambiguated record
Reginald Hunter
Also filed as: HUNTER REGINALD · HUNTER REGINALD W · HUNTER REGINALD WILLIAM
25 granted patents·7 pending applications·1,232 citations·filing 1992–2008
98Inventor score
Top patents by PatentIndex Score
32 records- 0198US6244121B1Sensor device for non-intrusive diagnosis of a semiconductor processing systemAPPLIED MATERIALS INC·Filed 1998·Granted Jun 12, 2001·258 cites·26 claims
- 0297US7331250B2Sensor device for non-intrusive diagnosis of a semiconductor processing systemAPPLIED MATERIALS INC·Filed 2006·Granted Feb 19, 2008·42 cites·24 claims
- 0397US6468816B2Method for sensing conditions within a substrate processing systemAPPLIED MATERIALS INC·Filed 2001·Granted Oct 22, 2002·84 cites·25 claims
- 0496US7434485B2Sensor device for non-intrusive diagnosis of a semiconductor processing systemAPPLIED MATERIALS INC·Filed 2006·Granted Oct 14, 2008·25 cites·22 claims
- 0595US6721045B1Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniquesAPPLIED MATERIALS INC·Filed 2000·Granted Apr 13, 2004·70 cites·39 claims
- 0695US6630995B1Method and apparatus for embedded substrate and system status monitoringAPPLIED MATERIALS INC·Filed 2000·Granted Oct 7, 2003·98 cites·41 claims
- 0794US6895831B2Sensor device for non-intrusive diagnosis of a semiconductor processing systemAPPLIED MATERIALS INC·Filed 2003·Granted May 24, 2005·47 cites·42 claims
- 0893US7012684B1Method and apparatus to provide for automated process verification and hierarchical substrate examinationAPPLIED MATERIALS INC·Filed 2000·Granted Mar 14, 2006·73 cites·18 claims
- 0991US6707545B1Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systemsAPPLIED MATERIALS INC·Filed 2000·Granted Mar 16, 2004·62 cites·32 claims
- 1091US6642853B2Movable wireless sensor device for performing diagnostics with a substrate processing systemAPPLIED MATERIALS INC·Filed 2002·Granted Nov 4, 2003·34 cites·5 claims
- 1190US6813032B1Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniquesAPPLIED MATERIALS INC·Filed 2000·Granted Nov 2, 2004·54 cites·22 claims
- 1290US6693708B1Method and apparatus for substrate surface inspection using spectral profiling techniquesAPPLIED MATERIALS INC·Filed 2000·Granted Feb 17, 2004·51 cites·28 claims
- 1390US6677166B2Method for confirming alignment of a substrate support mechanism in a semiconductor processing systemAPPLIED MATERIALS INC·Filed 2002·Granted Jan 13, 2004·31 cites·5 claims
- 1489US6882416B1Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysisAPPLIED MATERIALS INC·Filed 2000·Granted Apr 19, 2005·51 cites·40 claims
- 1588US6697517B1Particle detection and embedded vision system to enhance substrate yield and throughputAPPLIED MATERIALS INC·Filed 2000·Granted Feb 24, 2004·38 cites·23 claims
- 1682US6707544B1Particle detection and embedded vision system to enhance substrate yield and throughputAPPLIED MATERIALS INC·Filed 1999·Granted Mar 16, 2004·58 cites·41 claims
- 1781US6026896ATemperature control system for semiconductor processing facilitiesAPPLIED MATERIALS INC·Filed 1997·Granted Feb 22, 2000·59 cites·26 claims
- 1875US7969465B2Method and apparatus for substrate imagingAPPLIED MATERIALS INC·Filed 2006·Granted Jun 28, 2011·5 cites·23 claims
- 1975US6805137B2Method for removing contamination particles from substratesAPPLIED MATERIALS INC·Filed 2001·Granted Oct 19, 2004·18 cites·20 claims
- 2071US6779226B2Factory interface particle removal platformAPPLIED MATERIALS INC·Filed 2001·Granted Aug 24, 2004·14 cites·17 claims
- 2170US6878636B2Method for enhancing substrate processingAPPLIED MATERIALS INC·Filed 2002·Granted Apr 12, 2005·13 cites·18 claims
- 2269US6684523B2Particle removal apparatusAPPLIED MATERIALS INC·Filed 2001·Granted Feb 3, 2004·12 cites·14 claims
- 2365US6725564B2Processing platform with integrated particle removal systemAPPLIED MATERIALS INC·Filed 2001·Granted Apr 27, 2004·10 cites·15 claims
- 2458US2008288369A1Next Generation Eyewear RetailingHUNTER REGINALD W·Filed 2008·Application pending·0 cites
- 2552US6803998B2Ultra low cost position and status monitoring using fiber optic delay linesAPPLIED MATERIALS INC·Filed 2002·Granted Oct 12, 2004·9 cites·44 claims
- 2652US2005126315A1Sensor device for non-intrusive diagnosis of a semiconductor processing systemAPPLIED MATERIALS INC·Filed 2005·Application pending·0 cites
- 2750US5260563ACompact laser warning receiverTRACOR·Filed 1992·Granted Nov 9, 1993·16 cites·24 claims
- 2841US2004203172A1Method and apparatus for a chemical sensorURS CORP·Filed 2003·Application pending·0 cites
- 2937US2003037800A1Method for removing contamination particles from substrate processing chambersAPPLIED MATERIALS INC·Filed 2002·Application pending·0 cites
- 3037US2003037801A1Method for increasing the efficiency of substrate processing chamber contamination detectionAPPLIED MATERIALS INC·Filed 2002·Application pending·0 cites
- 3136US2003039087A1Substrate support apparatus to facilitate particle removalAPPLIED MATERIALS INC·Filed 2001·Application pending·0 cites
- 3236US2002196336A1Method and apparatus for substrate imagingAPPLIED MATERIALS INC·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →