Inventor · disambiguated record
Reed Linde
Also filed as: LINDE REED · LINDE REED A
12 granted patents·2 pending applications·55 citations·filing 2004–2021
89Inventor score
Top patents by PatentIndex Score
14 records- 0189US7969174B2Systems and methods for test time outlier detection and correction in integrated circuit testingOPTIMALTEST LTD·Filed 2009·Granted Jun 28, 2011·13 cites·15 claims
- 0288US7405586B2Ultra low pin count interface for die testingINTEL CORP·Filed 2006·Granted Jul 29, 2008·17 cites·24 claims
- 0386US9529036B2Systems and methods for test time outlier detection and correction in integrated circuit testingOPTIMAL PLUS LTD·Filed 2014·Granted Dec 27, 2016·4 cites·18 claims
- 0479US8421494B2Systems and methods for test time outlier detection and correction in integrated circuit testingBALOG GIL·Filed 2011·Granted Apr 16, 2013·3 cites·18 claims
- 0578US7528622B2Methods for slow test time detection of an integrated circuit during parallel testingOPTIMAL TEST LTD·Filed 2006·Granted May 5, 2009·8 cites·14 claims
- 0662US10118200B2System and method for binning at final testLINDE REED·Filed 2009·Granted Nov 6, 2018·3 cites·28 claims
- 0761US8838408B2Misalignment indication decision system and methodLINDE REED·Filed 2010·Granted Sep 16, 2014·2 cites·40 claims
- 0860US11919046B2System and method for binning at final testOPTIMAL PLUS LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 0959US8781773B2System and methods for parametric testingGUROV LEONID·Filed 2011·Granted Jul 15, 2014·1 cites·59 claims
- 1054US8872538B2Systems and methods for test time outlier detection and correction in integrated circuit testingOPTIMALTEST LTD·Filed 2013·Granted Oct 28, 2014·0 cites·18 claims
- 1153US11235355B2System and method for binning at final testOPTIMAL PLUS LTD·Filed 2018·Granted Feb 1, 2022·0 cites·20 claims
- 1243US7177189B2Memory defect detection and self-repair techniqueINTEL CORP·Filed 2004·Granted Feb 13, 2007·4 cites·29 claims
- 1341US2016321594A1Correlation between manufacturing segment and end- user device performanceOPTIMAL PLUS LTD·Filed 2015·Application pending·0 cites
- 1437US2009013218A1Datalog management in semiconductor testingOPTIMAL TEST LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →