Inventor · disambiguated record
Regina G. Nijmeijer
Also filed as: NIJMEIJER REGINA G
8 granted patents·2 pending applications·433 citations·filing 1998–2004
91Inventor score
Top patents by PatentIndex Score
10 records- 0195US6049220AApparatus and method for evaluating a wafer of semiconductor materialBOXER CROSS INC·Filed 1998·Granted Apr 11, 2000·151 cites·63 claims
- 0294US6489801B1Apparatus and method for evaluating a semiconductor waferFiled 2000·Granted Dec 3, 2002·66 cites·57 claims
- 0394US6483594B2Apparatus and method for determining the active dopant profile in a semiconductor waferBOXER CROSS INC·Filed 2001·Granted Nov 19, 2002·51 cites·29 claims
- 0494US6426644B1Apparatus and method for determining the active dopant profile in a semiconductor waferBOXER CROSS INC·Filed 2001·Granted Jul 30, 2002·47 cites·10 claims
- 0593US6323951B1Apparatus and method for determining the active dopant profile in a semiconductor waferBOXER CROSS INC·Filed 1999·Granted Nov 27, 2001·93 cites·26 claims
- 0667US6885458B2Apparatus and method for determining the active dopant profile in a semiconductor waferAPPLIED MATERIALS INC·Filed 2002·Granted Apr 26, 2005·4 cites·36 claims
- 0766US7130055B2Use of coefficient of a power curve to evaluate a semiconductor waferAPPLIED MATERIALS INC·Filed 2004·Granted Oct 31, 2006·10 cites·16 claims
- 0866US6812717B2Use of a coefficient of a power curve to evaluate a semiconductor waferBOXER CROSS INC·Filed 2001·Granted Nov 2, 2004·11 cites·34 claims
- 0954US2004239945A1Apparatus and method for determining the active dopant profile in a semiconductor waferFiled 2004·Application pending·0 cites
- 1042US2003085730A1Apparatus and method for evaluating a wafer of semiconductor materialFiled 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Regina G. Nijmeijer files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →