Inventor · disambiguated record
Reinhold Schmitt
Also filed as: SCHMITT REINHOLD
19 granted patents·4 pending applications·377 citations·filing 1975–2013
95Inventor score
Top patents by PatentIndex Score
23 records- 0188US4985681AParticle beam measuring method for non-contact testing of interconnect networksSIEMENS AG·Filed 1985·Granted Jan 15, 1991·55 cites·16 claims
- 0284US4558779AConveyor apparatus, in particular for use in packaging plantsROVEMA GMBH·Filed 1983·Granted Dec 17, 1985·35 cites·26 claims
- 0381US5414374AMethod for particle beam testing of substrates for liquid crystal displays (LCD)SIEMENS AG·Filed 1993·Granted May 9, 1995·37 cites·5 claims
- 0481US5268638AMethod for particle beam testing of substrates for liquid crystal displays "LCD"SIEMENS AG·Filed 1992·Granted Dec 7, 1993·38 cites·7 claims
- 0576US5371459AMethod for particle beam testing of substrates for liquid crystal displays using parasitic currentsSIEMENS AG·Filed 1993·Granted Dec 6, 1994·36 cites·7 claims
- 0670US5369359AParticle beam testing method with countervoltage or retarding voltage follow-up or feedbackSIEMENS AG·Filed 1992·Granted Nov 29, 1994·31 cites·17 claims
- 0769US4587481AArrangement for testing micro interconnections and a method for operating the sameSIEMENS AG·Filed 1983·Granted May 6, 1986·21 cites·12 claims
- 0865US6232601B1Dynamically compensated objective lens-detection device and methodADVANTEST CORP·Filed 1999·Granted May 15, 2001·18 cites·10 claims
- 0964US9719880B2Method for leak testing a housingTESAT-SPACECOM GMBH & CO KG·Filed 2013·Granted Aug 1, 2017·3 cites·12 claims
- 1059US6051838AOptical unitACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Apr 18, 2000·14 cites·23 claims
- 1158US5847399ADeflection systemACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Dec 8, 1998·13 cites·16 claims
- 1258US4380703AMethod and device for the regulation of a magnetic deflection systemSIEMENS AG·Filed 1980·Granted Apr 19, 1983·10 cites·5 claims
- 1358US4052668AArrangement comprising a high voltage measuring capacitorSIEMENS AG·Filed 1975·Granted Oct 4, 1977·16 cites·6 claims
- 1454US4891523ACircuit for image displacement in a particle beam apparatus independently of magnificationSIEMENS AG·Filed 1988·Granted Jan 2, 1990·8 cites·5 claims
- 1553US4211799AMethods for making flocculation-resistant citrus juiceROEHM GMBH·Filed 1978·Granted Jul 8, 1980·13 cites·7 claims
- 1649US2008135786A1Adjustable aperture element for particle beam device, method of operating and manufacturing thereofLANIO STEFAN·Filed 2007·Application pending·0 cites
- 1747US4539477AMethod and apparatus for suppressing disturbances in the measurement of signals with a particle probeSIEMENS AG·Filed 1983·Granted Sep 3, 1985·9 cites·15 claims
- 1846US2007294889A1Electronic circuit module and method for its assemblySCHMITT REINHOLD·Filed 2007·Application pending·0 cites
- 1945US4748407AMethod and apparatus for measuring time dependent signals with a particle probeSIEMENS AG·Filed 1987·Granted May 31, 1988·9 cites·9 claims
- 2044US4109017AMethod for clarification of fruit juiceROEHM GMBH·Filed 1976·Granted Aug 22, 1978·10 cites·5 claims
- 2141US6459283B1Method and system for testing an electrical componentADVANTEST CORP·Filed 2000·Granted Oct 1, 2002·1 cites·9 claims
- 2235US2005128692A1Electric circuit module and method for its assemblyFiled 2002·Application pending·0 cites
- 2332US2007274056A1Circuit Assembly and Method of its ManufactureSCHMITT REINHOLD·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →