Inventor · disambiguated record
Remco Schoenmakers
Also filed as: SCHOENMAKERS REMCO · SCHOENMAKERS REMCO HUBERTUS MARIA
17 granted patents·8 pending applications·47 citations·filing 2011–2024
90Inventor score
Top patents by PatentIndex Score
25 records- 0192US12175648B2Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a methodFEI CO·Filed 2023·Granted Dec 24, 2024·2 cites·22 claims
- 0291US11488800B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2021·Granted Nov 1, 2022·2 cites·20 claims
- 0391US8338782B2Detector system for transmission electron microscopeLUECKEN UWE·Filed 2011·Granted Dec 25, 2012·17 cites·14 claims
- 0488US9147551B2Method for electron tomographyFEI CO·Filed 2014·Granted Sep 29, 2015·10 cites·20 claims
- 0585US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0685US8912491B2Method of performing tomographic imaging of a sample in a charged-particle microscopeFEI CO·Filed 2013·Granted Dec 16, 2014·7 cites·18 claims
- 0782US9934936B2Charged particle microscope with special aperture plateFEI CO·Filed 2015·Granted Apr 3, 2018·4 cites·20 claims
- 0875US2025348669A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 0975US2025348670A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 1074US12136532B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 1174US2025348668A1Large language model assistance for charged-particle microscope operationFEI CO·Filed 2024·Application pending·0 cites
- 1264US11861817B2Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a methodFEI CO·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 1362US11482400B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2020·Granted Oct 25, 2022·0 cites·10 claims
- 1459US2024110880A1Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle SystemsFEI CO·Filed 2022·Application pending·0 cites
- 1555US11901155B2Method of aligning a charged particle beam apparatusFEI CO·Filed 2021·Granted Feb 13, 2024·0 cites·18 claims
- 1655US10903043B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2018·Granted Jan 26, 2021·0 cites·12 claims
- 1755US9618460B2Method of performing tomographic imaging of a sample in a charged-particle microscopeFEI CO·Filed 2013·Granted Apr 11, 2017·1 cites·20 claims
- 1852US2025251262A1Tool matching using digital twinsFEI CO·Filed 2024·Application pending·0 cites
- 1951US11417497B2Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquiredFEI CO·Filed 2020·Granted Aug 16, 2022·0 cites·20 claims
- 2051US2025238571A1Digital twin calibrationFEI ELECTRON OPTICS B V·Filed 2024·Application pending·0 cites
- 2150US11100612B2Acquisition strategy for neural network based image restorationFEI CO·Filed 2019·Granted Aug 24, 2021·0 cites·18 claims
- 2242US10593068B2Tomographic imaging methodFEI CO·Filed 2017·Granted Mar 17, 2020·0 cites·19 claims
- 2339US10481378B2Interactive graphical representation of image quality and control thereofFEI CO·Filed 2016·Granted Nov 19, 2019·0 cites·29 claims
- 2439US2020111219A1Object tracking using image segmentationFEI CO·Filed 2019·Application pending·0 cites
- 2536US2016253297A1Methods and systems for managing multiple versions of a process in a processing chainFEI CO·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Remco Schoenmakers files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →