Inventor · disambiguated record
Richard Burch
Also filed as: BURCH RICHARD · BURCH RICHARD M
18 granted patents·3 pending applications·131 citations·filing 1977–2024
91Inventor score
Top patents by PatentIndex Score
21 records- 0192US4822425AAggregate stabilizationBURCH RICHARD M·Filed 1987·Granted Apr 18, 1989·82 cites·22 claims
- 0283US2025138505A1Sequenced Approach for Determining Wafer Path QualityPDF SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 0377US12223012B2Machine learning variable selection and root cause discovery by cumulative predictionPDF SOLUTIONS INC·Filed 2020·Granted Feb 11, 2025·1 cites·6 claims
- 0474US12229945B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 0574US11640328B2Predicting equipment fail mode from process tracePDF SOLUTIONS INC·Filed 2021·Granted May 2, 2023·1 cites·7 claims
- 0674US7024642B2Extraction method of defect density and size distributionsPDF SOLUTIONS INC·Filed 2002·Granted Apr 4, 2006·16 cites·24 claims
- 0773US7415386B2Method and system for failure signal detection analysisPDF SOLUTIONS INC·Filed 2003·Granted Aug 19, 2008·22 cites·16 claims
- 0871US10268562B1Advanced manufacturing insight system for semiconductor applicationPDF SOLUTIONS INC·Filed 2017·Granted Apr 23, 2019·2 cites·12 claims
- 0970US2022066410A1Sequenced Approach For Determining Wafer Path QualityPDF SOLUTIONS INC·Filed 2021·Application pending·0 cites
- 1065US11763446B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1160US6682593B2Aggregate stabilizing emulsion and a mixture of the emulsion with aggregateARR MAZ PRODUCTS LP·Filed 2002·Granted Jan 27, 2004·4 cites·21 claims
- 1257US11972552B2Abnormal wafer image classificationPDF SOLUTIONS INC·Filed 2021·Granted Apr 30, 2024·0 cites·20 claims
- 1357US11640160B2Pattern-enhanced spatial correlation of test structures to die level responsesPDF SOLUTIONS INC·Filed 2021·Granted May 2, 2023·0 cites·10 claims
- 1455US2024362106A1Predicting Equipment Fail Mode from Process TracePDF SOLUTIONS INC·Filed 2023·Application pending·0 cites
- 1551US11972987B2Die level product modeling without die level input dataPDF SOLUTIONS INC·Filed 2020·Granted Apr 30, 2024·0 cites·12 claims
- 1651US11609812B2Anomalous equipment trace detection and classificationPDF SOLUTIONS INC·Filed 2020·Granted Mar 21, 2023·0 cites·9 claims
- 1750US11328108B2Predicting die susceptible to early lifetime failurePDF SOLUTIONS INC·Filed 2021·Granted May 10, 2022·0 cites·15 claims
- 1849US11687439B2Automatic window generation for process tracePDF SOLUTIONS INC·Filed 2021·Granted Jun 27, 2023·0 cites·17 claims
- 1946US12038802B2Collaborative learning model for semiconductor applicationsPDF SOLUTIONS INC·Filed 2020·Granted Jul 16, 2024·0 cites·13 claims
- 2039US10656204B2Failure detection for wire bonding in semiconductorsPDF SOLUTIONS INC·Filed 2018·Granted May 19, 2020·0 cites·20 claims
- 2128US4131641ANickel recovery processROHM & HAAS·Filed 1977·Granted Dec 26, 1978·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →