Inventor · disambiguated record
Richard L. Guldi
Also filed as: GULDI RICHARD · GULDI RICHARD L
53 granted patents·13 pending applications·1,758 citations·filing 1993–2009
99Inventor score
Files withTEXAS INSTRUMENTS INC55GULDI RICHARD L3DETWEILER SHANGTING1MOSER BENJAMIN G1VISOKAY MARK ROBERT1
Top patents by PatentIndex Score
66 records- 0198US6710364B2Semiconductor wafer edge markingTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 23, 2004·576 cites·6 claims
- 0296US7579541B2Automatic page sequencing and other feedback action based on analysis of audio performance dataTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 25, 2009·36 cites·14 claims
- 0395US6967110B2Sensitive test structure for assessing pattern anomaliesTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 22, 2005·91 cites·15 claims
- 0490US5551165AEnhanced cleansing process for wafer handling implementsTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 3, 1996·56 cites·19 claims
- 0589US6420792B1Semiconductor wafer edge markingTEXAS INSTRUMENTS INC·Filed 2000·Granted Jul 16, 2002·43 cites·19 claims
- 0689US5841543AMethod and apparatus for verifying the presence of a material applied to a substrateTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 24, 1998·100 cites·13 claims
- 0788US7772867B2Structures for testing and locating defects in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Aug 10, 2010·13 cites·17 claims
- 0886US5520205AApparatus for wafer cleaning with rotationTEXAS INSTRUMENTS INC·Filed 1994·Granted May 28, 1996·79 cites·12 claims
- 0985US7596456B2Method and apparatus for cassette integrity testing using a wafer sorterTEXAS INSTRUMENTS INC·Filed 2005·Granted Sep 29, 2009·16 cites·23 claims
- 1085US6202318B1System for processing wafers and cleaning wafer-handling implementsTEXAS INSTRUMENTS INC·Filed 2000·Granted Mar 20, 2001·37 cites·7 claims
- 1184US6488037B1Programmable physical action during integrated circuit wafer cleanupTEXAS INSTRUMENTS INC·Filed 2000·Granted Dec 3, 2002·27 cites·12 claims
- 1283US7212607B1X-ray confocal defect detection systems and methodsTEXAS INSTRUMENTS INC·Filed 2006·Granted May 1, 2007·9 cites·24 claims
- 1382US7228193B2Methods for detecting structure dependent process defectsTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 5, 2007·6 cites·21 claims
- 1481US6834117B1X-ray defect detection in integrated circuit metallizationTEXAS INSTRUMENTS INC·Filed 2000·Granted Dec 21, 2004·31 cites·19 claims
- 1579US6197123B1Method for cleaning a process chamber used for manufacturing substrates during nonproduction intervalsTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 6, 2001·56 cites·7 claims
- 1678US7601629B2Semiconductive device fabricated using subliming materials to form interlevel dielectricsTEXAS INSTRUMENTS INC·Filed 2005·Granted Oct 13, 2009·8 cites·16 claims
- 1778US6684125B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2001·Granted Jan 27, 2004·16 cites·9 claims
- 1878US6305097B1Apparatus for in-situ reticle cleaning at photolithography toolTEXAS INSTRUMENTS INC·Filed 2000·Granted Oct 23, 2001·24 cites·20 claims
- 1978US5698040AMethod for rotational wafer cleaning in solutionTEXAS INSTRUMENTS INC·Filed 1995·Granted Dec 16, 1997·45 cites·9 claims
- 2076US5334556AMethod for improving gate oxide integrity using low temperature oxidation during source/drain annealTEXAS INSTRUMENTS INC·Filed 1993·Granted Aug 2, 1994·59 cites·26 claims
- 2174US6689686B2System and method for electroplating fine geometriesTEXAS INSTRUMENTS INC·Filed 2002·Granted Feb 10, 2004·8 cites·9 claims
- 2272US6975920B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 13, 2005·11 cites·5 claims
- 2371US6862495B2In-situ randomization and recording of wafer processing order at process toolsTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 1, 2005·10 cites·4 claims
- 2470US6267122B1Semiconductor cleaning solution and methodTEXAS INSTRUMENTS INC·Filed 1993·Granted Jul 31, 2001·53 cites·5 claims
- 2569US5698038AMethod for wafer carrier cleaningTEXAS INSTRUMENTS INC·Filed 1995·Granted Dec 16, 1997·31 cites·3 claims
- 2668US6096100AMethod for processing wafers and cleaning wafer-handling implementsTEXAS INSTRUMENTS INC·Filed 1997·Granted Aug 1, 2000·33 cites·13 claims
- 2767US6395102B1Method and apparatus for in-situ reticle cleaning at photolithography toolTEXAS INSTRUMENTS INC·Filed 1998·Granted May 28, 2002·29 cites·22 claims
- 2865US6442867B2Apparatus and method for cleaning a vertical furnace pedestal and capTEXAS INSTRUMENTS INC·Filed 2000·Granted Sep 3, 2002·13 cites·18 claims
- 2963US5525529AMethod for reducing dopant diffusionTEXAS INSTRUMENTS INC·Filed 1994·Granted Jun 11, 1996·34 cites·20 claims
- 3062US5535471ATool for cleaning LPCVD furnace tubeTEXAS INSTRUMENTS INC·Filed 1993·Granted Jul 16, 1996·15 cites·17 claims
- 3160US6298282B1Robot crash sensor systemTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 2, 2001·22 cites·31 claims
- 3257US8273523B2By-die-exposure for patterning of holes in edge dieDETWEILER SHANGTING·Filed 2006·Granted Sep 25, 2012·3 cites·18 claims
- 3357US6645684B2Error reduction in semiconductor processesTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 11, 2003·4 cites·15 claims
- 3456US5839455AEnhanced high pressure cleansing system for wafer handling implementsTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 24, 1998·24 cites·15 claims
- 3554US7024950B2Method for intelligent sampling of particulates in exhaust linesTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 11, 2006·7 cites·12 claims
- 3654US6848066B2Error reduction in semiconductor processesTEXAS INSTRUMENTS INC·Filed 2003·Granted Jan 25, 2005·3 cites·5 claims
- 3754US6174817B1Two step oxide removal for memory cellsTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 16, 2001·24 cites·12 claims
- 3853US6180424B1Method for improving wafer sleuth capability by adding wafer rotation trackingTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 30, 2001·17 cites·19 claims
- 3948US6067163AAutomated substrate pattern recognition systemTEXAS INSTRUMENTS INC·Filed 1996·Granted May 23, 2000·14 cites·17 claims
- 4048US5958517ASystem and method for cleaning nozzle delivering spin-on-glass to substrateTEXAS INSTRUMENTS INC·Filed 1997·Granted Sep 28, 1999·17 cites·22 claims
- 4147US2006033503A1Sensitive test structure for assessing pattern anomaliesGULDI RICHARD L·Filed 2005·Application pending·0 cites
- 4246US7374866B2System and method for exposure of partial edge dieTEXAS INSTRUMENTS INC·Filed 2004·Granted May 20, 2008·2 cites·12 claims
- 4346US6572461B2Method for producing wafer notches with rounded corners and a tool thereforTEXAS INSTRUMENTS INC·Filed 2001·Granted Jun 3, 2003·2 cites·12 claims
- 4446US2009102501A1Test structures for e-beam testing of systematic and random defects in integrated circuitsGULDI RICHARD L·Filed 2007·Application pending·0 cites
- 4546US2009087938A1Method for Manufacturing Microdevices or Integrated Circuits on Continuous SheetsTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 4645US6239003B1Method of simultaneous fabrication of isolation and gate regions in a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted May 29, 2001·12 cites·14 claims
- 4745US5506169AMethod for reducing lateral dopant diffusionTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 9, 1996·14 cites·13 claims
- 4845US2008056557A1System and method for analyzing a light beam of a wafer inspection tool or an exposure toolTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 4945US2007288961A1Channel selection based on program content attributesGULDI RICHARD L·Filed 2006·Application pending·0 cites
- 5045US2008176345A1Ebeam inspection for detecting gate dielectric punch through and/or incomplete silicidation or metallization events for transistors having metal gate electrodesTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →