Inventor · disambiguated record
Risho Koh
Also filed as: KOH RISHO
16 granted patents·3 pending applications·668 citations·filing 1992–2017
94Inventor score
Top patents by PatentIndex Score
19 records- 0197US5545586AMethod of making a transistor having easily controllable impurity profileNEC CORP·Filed 1994·Granted Aug 13, 1996·232 cites·4 claims
- 0296US7719043B2Semiconductor device with fin-type field effect transistor and manufacturing method thereof.NEC CORP·Filed 2005·Granted May 18, 2010·64 cites·22 claims
- 0393US6049110ABody driven SOI-MOS field effect transistorNEC CORP·Filed 1997·Granted Apr 11, 2000·115 cites·149 claims
- 0485US7830703B2Semiconductor device and manufacturing method thereofNEC CORP·Filed 2005·Granted Nov 9, 2010·13 cites·35 claims
- 0585US6306691B1Body driven SOI-MOS field effect transistor and method of forming the sameNEC CORP·Filed 1999·Granted Oct 23, 2001·56 cites·3 claims
- 0685US5427976AMethod of producing a semiconductor on insulating substrate, and a method of forming a transistor thereonNEC CORP·Filed 1992·Granted Jun 27, 1995·86 cites·8 claims
- 0777US9558967B2Method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·3 cites·12 claims
- 0876US6933569B2Soi mosfetNEC CORP·Filed 2003·Granted Aug 23, 2005·24 cites·17 claims
- 0970US5668046AMethod of producing a semiconductor on insulating substrate, and a method of forming transistor thereonNEC CORP·Filed 1995·Granted Sep 16, 1997·34 cites·13 claims
- 1069US8633726B2Semiconductor device evaluation apparatus and semiconductor device evaluation methodKOH RISHO·Filed 2012·Granted Jan 21, 2014·3 cites·25 claims
- 1167US10496782B2Element model and process design kitRENESAS ELECTRONICS CORP·Filed 2017·Granted Dec 3, 2019·1 cites·15 claims
- 1264US6975001B2Semiconductor device and method of fabricating the sameNEC CORP·Filed 2002·Granted Dec 13, 2005·10 cites·33 claims
- 1359US5770506AMethod of fabricating a field effect transistor with short gate lengthNEC CORP·Filed 1997·Granted Jun 23, 1998·19 cites·10 claims
- 1455US7485923B2SOI semiconductor device with improved halo region and manufacturing method of the sameNEC CORP·Filed 2002·Granted Feb 3, 2009·6 cites·13 claims
- 1544US7611934B2Semiconductor device and method of fabricating the sameNEC CORP·Filed 2005·Granted Nov 3, 2009·0 cites·28 claims
- 1643US7211517B2Semiconductor device and method that includes reverse tapering multiple layersNEC CORP·Filed 2002·Granted May 1, 2007·2 cites·20 claims
- 1738US2007257277A1Semiconductor Device and Method for Manufacturing the SameNEC CORP·Filed 2005·Application pending·0 cites
- 1838US2007158700A1Field effect transistor and method for producing the sameNEC CORP·Filed 2005·Application pending·0 cites
- 1932US2009014795A1Substrate for field effect transistor, field effect transistor and method for production thereofKOH RISHO·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →