Inventor · disambiguated record
Rinat Shimshi
Also filed as: SHIMSHI RINAT
9 granted patents·1 pending application·160 citations·filing 2006–2012
89Inventor score
Top patents by PatentIndex Score
10 records- 0194US7760929B2Grouping systematic defects with feedback from electrical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·42 cites·10 claims
- 0291US8224607B2Method and apparatus for robot calibrations with a calibrating deviceSAKHARE VIJAY·Filed 2008·Granted Jul 17, 2012·32 cites·13 claims
- 0388US7937179B2Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defectsAPPLIED MATERIALS INC·Filed 2008·Granted May 3, 2011·24 cites·19 claims
- 0486US8688398B2Method and apparatus for robot calibrations with a calibrating deviceSAKHARE VIJAY·Filed 2012·Granted Apr 1, 2014·10 cites·21 claims
- 0583US7962864B2Stage yield predictionAPPLIED MATERIALS INC·Filed 2008·Granted Jun 14, 2011·15 cites·21 claims
- 0678US8260461B2Method and system for robot calibrations with a cameraKRISHNASAMY SEKAR·Filed 2008·Granted Sep 4, 2012·21 cites·20 claims
- 0770US8335582B2Software application to analyze event log and chart tool fail rate as function of chamber and recipeSHIMSHI RINAT·Filed 2009·Granted Dec 18, 2012·8 cites·24 claims
- 0868US8799831B2Inline defect analysis for sampling and SPCNEHMADI YOUVAL·Filed 2008·Granted Aug 5, 2014·6 cites·24 claims
- 0952US8924904B2Method and apparatus for determining factors for design consideration in yield analysisSVIDENKO VICKY·Filed 2008·Granted Dec 30, 2014·2 cites·18 claims
- 1042US2010073011A1Light soaking system and test method for solar cellsAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →