Inventor · disambiguated record
Ronald Baldner
Also filed as: BALDNER RONALD F
2 granted patents·3 pending applications·7 citations·filing 2002–2010
55Inventor score
Technology areasH10P
Top patents by PatentIndex Score
5 records- 0170US8765000B2Microfeature workpiece processing system for, e.g., semiconductor wafer analysisPALSULICH DAVID A·Filed 2010·Granted Jul 1, 2014·4 cites·19 claims
- 0248US7763548B2Microfeature workpiece processing system for, e.g., semiconductor wafer analysisMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 27, 2010·3 cites·18 claims
- 0345US2006191866A1Microfeature workpiece processing system for, e.g., semiconductor wafer analysisMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 0436US2006104870A1Wafer-scale microwave digestion apparatus and methodsRUMPS J E·Filed 2005·Application pending·0 cites
- 0528US2004043500A1Wafer-scale microwave digestion apparatus and methodsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →