Inventor · disambiguated record
Roger A. Dufresne
Also filed as: DUFRESNE ROGER · DUFRESNE ROGER A · DUFRESNE ROGER AIME
12 granted patents·3 pending applications·53 citations·filing 1997–2022
87Inventor score
Top patents by PatentIndex Score
15 records- 0184US8890556B2Real-time on-chip EM performance monitoringCHEN FEN·Filed 2011·Granted Nov 18, 2014·6 cites·19 claims
- 0272US5898706AStructure and method for reliability stressing of dielectricsIBM·Filed 1997·Granted Apr 27, 1999·34 cites·20 claims
- 0371US9059052B2Alternating open-ended via chains for testing via formation and dielectric integrityIBM·Filed 2013·Granted Jun 16, 2015·2 cites·20 claims
- 0469US9453873B2Non-planar field effect transistor test structure and lateral dielectric breakdown testing methodIBM·Filed 2014·Granted Sep 27, 2016·2 cites·20 claims
- 0569US8917104B2Analyzing EM performance during IC manufacturingCHEN FEN·Filed 2011·Granted Dec 23, 2014·2 cites·19 claims
- 0669US8754655B2Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migrationBROCHU JR DAVID G·Filed 2011·Granted Jun 17, 2014·3 cites·25 claims
- 0764US9029172B2On-chip poly-to-contact process monitoring and reliability evaluation system and method of useCHEN FEN·Filed 2012·Granted May 12, 2015·1 cites·16 claims
- 0852US2023050049A1Water Sports DeviceDUFRESNE ROGER·Filed 2022·Application pending·0 cites
- 0949US6743655B2Negative differential resistance reoxidized nitride silicon-based photodiode and methodIBM·Filed 2002·Granted Jun 1, 2004·2 cites·8 claims
- 1046US9780031B2Wiring structuresIBM·Filed 2014·Granted Oct 3, 2017·0 cites·17 claims
- 1146US6445021B1Negative differential resistance reoxidized nitride silicon-based photodiode and methodIBM·Filed 2000·Granted Sep 3, 2002·1 cites·10 claims
- 1245US2015221567A1Alternating open-ended via chains for testing via formation and dielectric integrityIBM·Filed 2015·Application pending·0 cites
- 1341US10103060B2Test structures for dielectric reliability evaluationsGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 16, 2018·0 cites·20 claims
- 1440US9851398B2Via leakage and breakdown testingGLOBALFOUNDRIES INC·Filed 2015·Granted Dec 26, 2017·0 cites·18 claims
- 1533US2012187974A1Dual Stage Voltage Ramp Stress Test for Gate DielectricsBROCHU JR DAVID G·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →