Inventor · disambiguated record
Romain Esteve
Also filed as: ESTEVE ROMAIN
49 granted patents·9 pending applications·202 citations·filing 2012–2023
97Inventor score
Files withINFINEON TECHNOLOGIES AG50INFINEON TECHNOLOGIES AUSTRIA AG4INFINEON TECHNOLOGIES AUSTRIA2Nexperia BV2
Top patents by PatentIndex Score
58 records- 0198US9478655B2Semiconductor device having a lower diode region arranged below a trenchINFINEON TECHNOLOGIES AG·Filed 2015·Granted Oct 25, 2016·28 cites·30 claims
- 0297US9837527B2Semiconductor device with a trench electrodeINFINEON TECHNOLOGIES AG·Filed 2015·Granted Dec 5, 2017·22 cites·28 claims
- 0397US9293558B2Semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA·Filed 2012·Granted Mar 22, 2016·31 cites·10 claims
- 0496US10332876B2Method of forming compound semiconductor bodyINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2017·Granted Jun 25, 2019·16 cites·17 claims
- 0596US9577073B2Method of forming a silicon-carbide device with a shielded gateINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 21, 2017·19 cites·18 claims
- 0694US10700192B2Semiconductor device having a source electrode contact trenchINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jun 30, 2020·7 cites·20 claims
- 0794US10211306B2Semiconductor device with diode region and trench gate structureINFINEON TECHNOLOGIES AG·Filed 2018·Granted Feb 19, 2019·15 cites·21 claims
- 0894US10074741B2Semiconductor device with trench gate structure including a gate electrode and a contact structure for a diode regionINFINEON TECHNOLOGIES AG·Filed 2016·Granted Sep 11, 2018·10 cites·23 claims
- 0994US9741712B2Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal latticeINFINEON TECHNOLOGIES AG·Filed 2016·Granted Aug 22, 2017·8 cites·21 claims
- 1093US10586845B1SiC trench transistor device and methods of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2018·Granted Mar 10, 2020·9 cites·25 claims
- 1192US9997515B2Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal latticeINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jun 12, 2018·6 cites·24 claims
- 1291US10038087B2Semiconductor device and transistor cell having a diode regionINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jul 31, 2018·4 cites·20 claims
- 1390US9818818B2Power semiconductor device including trench gate structures with longitudinal axes tilted to a main crystal directionINFINEON TECHNOLOGIES AG·Filed 2016·Granted Nov 14, 2017·6 cites·15 claims
- 1487US10727330B2Semiconductor device with diode regionINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jul 28, 2020·2 cites·20 claims
- 1584US9876103B2Semiconductor device and transistor cell having a diode regionINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jan 23, 2018·2 cites·20 claims
- 1682US9209318B2Vertical JFET with body diode and device regions disposed in a single compound epitaxial layerINFINEON TECHNOLOGIES AUSTRIA·Filed 2013·Granted Dec 8, 2015·4 cites·5 claims
- 1780US10679983B2Method of producing a semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Granted Jun 9, 2020·2 cites·7 claims
- 1879US10700182B2Semiconductor device with transistor cells and a drift structure and method of manufacturingINFINEON TECHNOLOGIES AG·Filed 2018·Granted Jun 30, 2020·2 cites·26 claims
- 1978US10217636B2Method of manufacturing a silicon carbide semiconductor device by removing amorphized portionsINFINEON TECHNOLOGIES AG·Filed 2018·Granted Feb 26, 2019·2 cites·17 claims
- 2073US9960230B2Silicon-carbide transistor device with a shielded gateINFINEON TECHNOLOGIES AG·Filed 2017·Granted May 1, 2018·1 cites·20 claims
- 2172US9029974B2Semiconductor device, junction field effect transistor and vertical field effect transistorINFINEON TECHNOLOGIES AG·Filed 2013·Granted May 12, 2015·3 cites·17 claims
- 2271US10985248B2SiC power semiconductor device with integrated Schottky junctionINFINEON TECHNOLOGIES AG·Filed 2019·Granted Apr 20, 2021·1 cites·20 claims
- 2371US10256097B2Forming a metal contact layer on silicon carbide and semiconductor device with metal contact structureINFINEON TECHNOLOGIES AG·Filed 2017·Granted Apr 9, 2019·1 cites·15 claims
- 2469US11462611B2SiC device with channel regions extending along at least one of the (1-100) plane and the (-1100) plane and methods of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2020·Granted Oct 4, 2022·0 cites·15 claims
- 2568US11626477B2Silicon carbide field-effect transistor including shielding areasINFINEON TECHNOLOGIES AG·Filed 2021·Granted Apr 11, 2023·0 cites·23 claims
- 2668US10553685B2SiC semiconductor device with offset in trench bottomINFINEON TECHNOLOGIES AG·Filed 2018·Granted Feb 4, 2020·1 cites·24 claims
- 2766US10896952B2SiC device and methods of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jan 19, 2021·0 cites·16 claims
- 2863US11881512B2Method of manufacturing semiconductor device with silicon carbide bodyINFINEON TECHNOLOGIES AG·Filed 2021·Granted Jan 23, 2024·0 cites·14 claims
- 2963US11195946B2Method of manufacturing a silicon carbide semiconductor device with trench gate structure and vertical pn junction between body region and drift structureINFINEON TECHNOLOGIES AG·Filed 2021·Granted Dec 7, 2021·0 cites·20 claims
- 3063US2018315845A1Semiconductor Device and Transistor Cell Having a Diode RegionINFINEON TECHNOLOGIES AG·Filed 2018·Application pending·0 cites
- 3162US11842938B2Semiconductor device and method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2021·Granted Dec 12, 2023·0 cites·18 claims
- 3260US11101343B2Silicon carbide field-effect transistor including shielding areasINFINEON TECHNOLOGIES AG·Filed 2019·Granted Aug 24, 2021·0 cites·20 claims
- 3360US10361192B2Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal latticeINFINEON TECHNOLOGIES AG·Filed 2018·Granted Jul 23, 2019·0 cites·25 claims
- 3457US11195921B2Semiconductor device with silicon carbide bodyINFINEON TECHNOLOGIES AG·Filed 2019·Granted Dec 7, 2021·0 cites·16 claims
- 3557US10964808B2Silicon carbide semiconductor device with trench gate structure and vertical PN junction between body region and drift structureINFINEON TECHNOLOGIES AG·Filed 2018·Granted Mar 30, 2021·0 cites·30 claims
- 3657US10915029B2Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zoneINFINEON TECHNOLOGIES AG·Filed 2018·Granted Feb 9, 2021·0 cites·20 claims
- 3756US2018248000A1Vertical Transistor Device with a Variable Gate Dielectric ThicknessINFINEON TECHNOLOGIES AG·Filed 2018·Application pending·0 cites
- 3855US10734514B2Semiconductor device with trench gate structure including a gate electrode and a contact structure for a diode regionINFINEON TECHNOLOGIES AG·Filed 2018·Granted Aug 4, 2020·0 cites·19 claims
- 3955US9941272B2Method of producing a semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2016·Granted Apr 10, 2018·0 cites·7 claims
- 4055US2018053841A1Semiconductor Device with a Source Trench ElectrodeINFINEON TECHNOLOGIES AG·Filed 2017·Application pending·0 cites
- 4154US2025113592A1Semiconductor device with schottky contactINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 4253US11764063B2Silicon carbide device with compensation region and method of manufacturingINFINEON TECHNOLOGIES AG·Filed 2020·Granted Sep 19, 2023·0 cites·22 claims
- 4353US10120287B2Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zoneINFINEON TECHNOLOGIES AG·Filed 2016·Granted Nov 6, 2018·0 cites·24 claims
- 4453US9666696B2Method of manufacturing a vertical junction field effect transistorINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2015·Granted May 30, 2017·0 cites·12 claims
- 4552US11552172B2Silicon carbide device with compensation layer and method of manufacturingINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jan 10, 2023·0 cites·13 claims
- 4652US2023238442A1Semiconductor device with metal nitride layer and a method of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 4751US11901407B2Semiconductor device with improved junction termination extension regionNexperia BV·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 4851US11380756B2Silicon carbide device with Schottky contactINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 4951US11217500B2Semiconductor device and method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jan 4, 2022·0 cites·26 claims
- 5050US10580878B1SiC device with buried doped regionINFINEON TECHNOLOGIES AG·Filed 2018·Granted Mar 3, 2020·0 cites·20 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →