Inventor · disambiguated record
Robert L. Gerlach
Also filed as: GERLACH ROBERT · GERLACH ROBERT L
25 granted patents·4 pending applications·701 citations·filing 1975–2016
97Inventor score
Files withFEI CO11PERKIN ELMER CORP9GERLACH ROBERT3GERLACH CONSULTING GROUP INC1PHYSICAL ELECTRONICS IND INC1
Top patents by PatentIndex Score
29 records- 0195US6900447B2Focused ion beam system with coaxial scanning electron microscopeFEI CO·Filed 2003·Granted May 31, 2005·77 cites·36 claims
- 0291US4048498AScanning auger microprobe with variable axial aperturePHYSICAL ELECTRONICS IND INC·Filed 1976·Granted Sep 13, 1977·37 cites·14 claims
- 0390US6683320B2Through-the-lens neutralization for charged particle beam systemFEI CO·Filed 2001·Granted Jan 27, 2004·32 cites·22 claims
- 0489US4659899AVacuum-compatible air-cooled plasma devicePERKIN ELMER CORP·Filed 1986·Granted Apr 21, 1987·44 cites·19 claims
- 0588US6946654B2Collection of secondary electrons through the objective lens of a scanning electron microscopeFEI CO·Filed 2001·Granted Sep 20, 2005·30 cites·31 claims
- 0687US6414307B1Method and apparatus for enhancing yield of secondary ionsFEI CO·Filed 1999·Granted Jul 2, 2002·123 cites·21 claims
- 0787US4345152AMagnetic lensPERKIN ELMER CORP·Filed 1980·Granted Aug 17, 1982·28 cites·6 claims
- 0886US7009187B2Particle detector suitable for detecting ions and electronsFEI CO·Filed 2003·Granted Mar 7, 2006·28 cites·21 claims
- 0984US6949756B2Shaped and low density focused ion beamsFEI CO·Filed 2001·Granted Sep 27, 2005·20 cites·29 claims
- 1084US4810880ADirect imaging monochromatic electron microscopePERKIN ELMER CORP·Filed 1987·Granted Mar 7, 1989·31 cites·5 claims
- 1184US4205226AAuger electron spectroscopyPERKIN ELMER CORP·Filed 1978·Granted May 27, 1980·21 cites·38 claims
- 1283US6977386B2Angular aperture shaped beam system and methodFEI CO·Filed 2003·Granted Dec 20, 2005·18 cites·9 claims
- 1382US6797953B2Electron beam system using multiple electron beamsFEI CO·Filed 2002·Granted Sep 28, 2004·38 cites·39 claims
- 1482US6710338B2Focused ion beam systemFEI CO·Filed 2001·Granted Mar 23, 2004·25 cites·16 claims
- 1579US8164059B2In-chamber electron detectorGERLACH ROBERT·Filed 2008·Granted Apr 24, 2012·5 cites·27 claims
- 1678US10715771B1Wide-gamut-color image formation and projectionGERLACH CONSULTING GROUP INC·Filed 2016·Granted Jul 14, 2020·4 cites·9 claims
- 1777US5241182APrecision electrostatic lens system and method of manufactureFEI CO·Filed 1992·Granted Aug 31, 1993·38 cites·34 claims
- 1876US6797969B2Multi-column FIB for nanofabrication applicationsFEI CO·Filed 2001·Granted Sep 28, 2004·12 cites·30 claims
- 1971US4412771ASample transport systemPERKIN ELMER CORP·Filed 1981·Granted Nov 1, 1983·35 cites·19 claims
- 2067US5032724AMultichannel charged-particle analyzerPERKIN ELMER CORP·Filed 1990·Granted Jul 16, 1991·23 cites·25 claims
- 2155US4296323ASecondary emission mass spectrometer mechanism to be used with other instrumentationPERKIN ELMER CORP·Filed 1980·Granted Oct 20, 1981·16 cites·11 claims
- 2250US2012199738A1In-chamber electron detectorGERLACH ROBERT·Filed 2012·Application pending·0 cites
- 2345US4882487ADirect imaging monochromatic electron microscopePERKIN ELMER CORP·Filed 1988·Granted Nov 21, 1989·5 cites·9 claims
- 2443US2004218387A1LED lighting arrays, fixtures and systems and method for determining human color perceptionFiled 2004·Application pending·0 cites
- 2541US8650975B2Test specimen for testing through-thickness propertiesGERLACH ROBERT·Filed 2010·Granted Feb 18, 2014·0 cites·19 claims
- 2640US2011070092A1Hybrid componentROLLS ROYCE PLC·Filed 2010·Application pending·0 cites
- 2739US4033904AInterchangeable specimen trays and apparatus for a vacuum type testing systemVARIAN ASSOCIATES·Filed 1975·Granted Jul 5, 1977·9 cites·16 claims
- 2837US2001032938A1Through-the-lens-collection of secondary particles for a focused ion beam systemFiled 2001·Application pending·0 cites
- 2934US4806754AHigh luminosity spherical analyzer for charged particlesPERKIN ELMER CORP·Filed 1987·Granted Feb 21, 1989·2 cites·11 claims
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