Inventor · disambiguated record
Robert Kaiser
Also filed as: KAISER ROBERT · Kaiser Robert Cresswell
44 granted patents·9 pending applications·483 citations·filing 1985–2016
98Inventor score
Files withINFINEON TECHNOLOGIES AG26ENTROPIC SYSTEMS INC6SIEMENS AG4ARGOS ASSOCIATES INC2ARKIVAL TECHNOLOGY CORP2
Top patents by PatentIndex Score
53 records- 0190US6728902B2Integrated circuit having a self-test device for carrying out a self-test of the integrated circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 27, 2004·68 cites·3 claims
- 0288US6560134B2Memory configuration with a central connection areaINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 6, 2003·52 cites·14 claims
- 0388US5647386AAutomatic precision cleaning apparatus with continuous on-line monitoring and feedbackENTROPIC SYSTEMS INC·Filed 1994·Granted Jul 15, 1997·80 cites·17 claims
- 0479US10159244B2Method for pooling hepatocytesLONZA WALKERSVILLE INC·Filed 2016·Granted Dec 25, 2018·1 cites·10 claims
- 0579US7494629B2Decontamination systemENTROPIC SYSTEMS INC·Filed 2006·Granted Feb 24, 2009·5 cites·15 claims
- 0675US8260086B2System and method for fusion of image pairs utilizing atmospheric and solar illumination modelingRILEY RONALD A·Filed 2009·Granted Sep 4, 2012·8 cites·20 claims
- 0774US8855740B1System and method for determining size and size distribution of magnetic nanoparticles using VSM magnetization dataARKIVAL TECHNOLOGY CORP·Filed 2014·Granted Oct 7, 2014·9 cites·15 claims
- 0874US6053952AMethod of dry cleaning using a highly fluorinated organic liquidENTROPIC SYSTEMS INC·Filed 1998·Granted Apr 25, 2000·23 cites·31 claims
- 0973US6404690B2Refresh drive circuit for a DRAMINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 11, 2002·20 cites·5 claims
- 1071US6353357B1Controlling transistor threshold potentials using substrate potentialsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Mar 5, 2002·15 cites·3 claims
- 1169US5536327ARemoval of hydrocarbon or fluorocarbon residues using coupling agent additivesENTROPIC SYSTEMS INC·Filed 1994·Granted Jul 16, 1996·27 cites·18 claims
- 1268US7163589B2Method and apparatus for decontamination of sensitive equipmentARGOS ASSOCIATES INC·Filed 2002·Granted Jan 16, 2007·8 cites·2 claims
- 1367US7910054B1Decontamination and/or cleaning of fragile materialsARGOS ASSOCIATES INC·Filed 2007·Granted Mar 22, 2011·1 cites·27 claims
- 1466US8700124B2System and method for determining size and size distribution of magnetic nanoparticles using VSM magnetization dataARKIVAL TECHNOLOGY CORP·Filed 2013·Granted Apr 15, 2014·4 cites·31 claims
- 1565US7034559B2Integrated test circuit in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 25, 2006·9 cites·20 claims
- 1663US7398444B2Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methodsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 8, 2008·4 cites·24 claims
- 1763US6535046B2Integrated semiconductor circuit with an increased operating voltageINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 18, 2003·9 cites·2 claims
- 1863US2009117165A1Decontamination system and method of decontaminationENTROPIC SYSTEMS INC·Filed 2009·Application pending·0 cites
- 1962US6415406B1Integrated circuit having a self-test device and method for producing the integrated circuitSIEMENS AG·Filed 1999·Granted Jul 2, 2002·22 cites·9 claims
- 2059US6868028B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 15, 2005·10 cites·9 claims
- 2156US7181643B2Method for comparing the address of a memory access with an already known address of a faulty memory cellINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 20, 2007·9 cites·2 claims
- 2256US6552549B1Method of reading electrical fuses/antifusesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 22, 2003·9 cites·4 claims
- 2356US6178124B1Integrated memory having a self-repair functionSIEMENS AG·Filed 1999·Granted Jan 23, 2001·16 cites·6 claims
- 2456US2010252066A1Method and apparatus for decontamination of sensitive equipmentKAISER ROBERT·Filed 2006·Application pending·0 cites
- 2553US6441677B1Integrated semiconductor circuit with an increased operating voltageINFINEON TECHNOLOGIES AG·Filed 2000·Granted Aug 27, 2002·5 cites·4 claims
- 2653US4711256AMethod and apparatus for removal of small particles from a surfaceKAISER ROBERT·Filed 1985·Granted Dec 8, 1987·20 cites·14 claims
- 2750US7047454B2Integrated circuit having a data processing unit and a buffer memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 16, 2006·6 cites·16 claims
- 2850US6800817B2Semiconductor component for connection to a test systemINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 5, 2004·6 cites·9 claims
- 2950US2006286148A1Method of forming implantsPPD INC·Filed 2006·Application pending·0 cites
- 3048US6715118B2Configuration for generating signal impulses of defined lengths in a module with a bist-functionINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 30, 2004·4 cites·4 claims
- 3145US6236612B1Integrated semiconductor memory configuration with self-buffering of supply voltagesSIEMENS AG·Filed 2000·Granted May 22, 2001·2 cites·6 claims
- 3245US2003049187A1Decontamination system and method of decontaminationFiled 2002·Application pending·0 cites
- 3344US6366518B1Circuit configuration for programming an electrically programmable elementINFINEON TECHNOLOGIES AG·Filed 2000·Granted Apr 2, 2002·4 cites·4 claims
- 3443US6807123B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 19, 2004·3 cites·12 claims
- 3542US6288939B1Circuit configuration for monitoring states of a memory deviceINFINEON TECHNOLOGIES·Filed 2000·Granted Sep 11, 2001·3 cites·5 claims
- 3642US2002149979A1Method for identifying an integrated circuit and integrated circuitFiled 2002·Application pending·0 cites
- 3740US5733416AProcess for water displacement and component recyclingENTROPIC SYSTEMS INC·Filed 1996·Granted Mar 31, 1998·9 cites·20 claims
- 3839US7296198B2Method for testing semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 13, 2007·2 cites·22 claims
- 3939US6768695B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 27, 2004·2 cites·11 claims
- 4038US6449206B2Semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 10, 2002·2 cites·15 claims
- 4136US7165198B2System for testing an integrated circuit using multiple test modesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 16, 2007·0 cites·23 claims
- 4236US6717437B2Semiconductor moduleINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 6, 2004·2 cites·6 claims
- 4336US6304491B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 16, 2001·1 cites·11 claims
- 4436US6292414B1Method for repairing defective memory cells of an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2000·Granted Sep 18, 2001·1 cites·13 claims
- 4534US10559222B2System, method, and apparatus for tracking turning informationGOPI CORP·Filed 2016·Granted Feb 11, 2020·0 cites·20 claims
- 4634US7808272B2Integrated circuitQIMONDA AG·Filed 2005·Granted Oct 5, 2010·0 cites·13 claims
- 4734US6804166B2Method and apparatus for operating a semiconductor memory at double data transfer rateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 12, 2004·0 cites·3 claims
- 4834US2006085704A1Semi-conductor component, as well as a process for the reading of test dataINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 4933US2004222812A1Integrated circuit having a test circuitFiled 2004·Application pending·0 cites
- 5032US6064228ACircuit configuration for generating digital signalsSIEMENS AG·Filed 1998·Granted May 16, 2000·2 cites·4 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →