Inventor · disambiguated record
Robert J. Lipp
Also filed as: LIPP ROBERT · LIPP ROBERT J
22 granted patents·3 pending applications·1,202 citations·filing 1978–2019
97Inventor score
Files withLIPP ROBERT J7AZTECH PARTNERS INC3CROSS CHECK TECHNOLOGY INC2CROSSCHECK TECHNOLOGY INC2ZYCAD CORP2
Top patents by PatentIndex Score
25 records- 0197US4165642AMonolithic CMOS digital temperature measurement circuitLIPP ROBERT J·Filed 1978·Granted Aug 28, 1979·106 cites·15 claims
- 0295US5371457AMethod and apparatus to test for current in an integrated circuitFiled 1991·Granted Dec 6, 1994·131 cites·41 claims
- 0394US5309090AApparatus for heating and controlling temperature in an integrated circuit chipLIPP ROBERT J·Filed 1990·Granted May 3, 1994·123 cites·4 claims
- 0493US6751219B1Multicast packet duplication at random node or at egress port with frame synchronizationAZTECH PARTNERS INC·Filed 2000·Granted Jun 15, 2004·113 cites·17 claims
- 0592US8000103B2Cooling system for contact cooled electronic modulesCLUSTERED SYSTEMS COMPANY·Filed 2008·Granted Aug 16, 2011·65 cites·38 claims
- 0692US6751238B1Phase re-alignment of SONET/SDH network switch without pointer manipulationAZTECH PARTNERS INC·Filed 2000·Granted Jun 15, 2004·70 cites·26 claims
- 0791US5764096AGeneral purpose, non-volatile reprogrammable switchGATEFIELD CORP·Filed 1996·Granted Jun 9, 1998·98 cites·15 claims
- 0888US10548245B2Liquid cooled open compute project rack insertLIPP ROBERT J·Filed 2018·Granted Jan 28, 2020·6 cites·16 claims
- 0988US5347177ASystem for interconnecting VLSI circuits with transmission line characteristicsLIPP ROBERT J·Filed 1993·Granted Sep 13, 1994·162 cites·47 claims
- 1084US4937826AMethod and apparatus for sensing defects in integrated circuit elementsCROSSCHECK TECHNOLOGY INC·Filed 1988·Granted Jun 26, 1990·44 cites·14 claims
- 1180US5367210AOutput buffer with reduced noiseLIPP ROBERT J·Filed 1992·Granted Nov 22, 1994·35 cites·13 claims
- 1279US6252273B1Nonvolatile reprogrammable interconnect cell with FN tunneling device for programming and eraseACTEL CORP·Filed 1998·Granted Jun 26, 2001·45 cites·17 claims
- 1378US10785897B2Liquid cooled open compute cold plateLIPP ROBERT J·Filed 2019·Granted Sep 22, 2020·2 cites·20 claims
- 1472US4975640AMethod for operating a linear feedback shift register as a serial shift register with a crosscheck grid structureCROSSCHECK TECHNOLOGY INC·Filed 1990·Granted Dec 4, 1990·34 cites·6 claims
- 1568US6594261B1Adaptive fault-tolerant switching network with random initial routing and random routing around faultsAZTECH PARTNERS INC·Filed 1999·Granted Jul 15, 2003·76 cites·22 claims
- 1667US5457653ATechnique to prevent deprogramming a floating gate transistor used to directly switch a large electrical signalZYCAD CORP·Filed 1994·Granted Oct 10, 1995·26 cites·9 claims
- 1765US11044141B2High density, high availability compute systemHUGHES PHILLIP N·Filed 2019·Granted Jun 22, 2021·1 cites·10 claims
- 1859US5773862AFloating gate FGPA cell with separated select deviceZYCAD CORP·Filed 1996·Granted Jun 30, 1998·19 cites·10 claims
- 1957US5037771AMethod for implementing grid-based crosscheck test structures and the structures resulting therefromCROSS CHECK TECHNOLOGY INC·Filed 1989·Granted Aug 6, 1991·23 cites·16 claims
- 2054US4682201AGate array cellCALIFORNIA DEVICES INC·Filed 1986·Granted Jul 21, 1987·17 cites·5 claims
- 2149US2013208422A1Contact cooled electronic enclosureHUGHES JOHN PHILLIP NEVILLE·Filed 2012·Application pending·0 cites
- 2248US8798287B2Vehicle sound simulation systemLIPP ROBERT·Filed 2010·Granted Aug 5, 2014·1 cites·18 claims
- 2344US2012037339A1Cooling system for contact cooled electronic modulesLIPP ROBERT J·Filed 2011·Application pending·0 cites
- 2441US2013271918A1Cold plate with reduced bubble effectsNEVILLE HUGHES JOHN PHILIP·Filed 2012·Application pending·0 cites
- 2533US5038349AMethod for reducing masking of errors when using a grid-based, "cross-check" test structureCROSS CHECK TECHNOLOGY INC·Filed 1989·Granted Aug 6, 1991·5 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →