Inventor · disambiguated record
Robert Lutz
Also filed as: LUTZ ROBERT · LUTZ ROBERT C · LUTZ ROBERT CLARE
20 granted patents·5 pending applications·466 citations·filing 1975–2025
94Inventor score
Top patents by PatentIndex Score
25 records- 0197US10536295B2Control infrastructureSYSTECH CORP·Filed 2019·Granted Jan 14, 2020·140 cites·20 claims
- 0297US10116461B2Control infrastructureSYSTECH CORP·Filed 2015·Granted Oct 30, 2018·148 cites·40 claims
- 0392US8295336B2High bandwidth programmable transmission line pre-emphasis method and circuitLUTZ ROBERT C·Filed 2010·Granted Oct 23, 2012·58 cites·22 claims
- 0484US6771086B2Semiconductor wafer electrical testing with a mobile chiller plate for rapid and precise test temperature controlLUCAS SIGNATONE CORP·Filed 2002·Granted Aug 3, 2004·68 cites·11 claims
- 0583US8138851B2High bandwidth programmable transmission line equalizerLUTZ ROBERT C·Filed 2010·Granted Mar 20, 2012·9 cites·32 claims
- 0681US8379702B2High bandwidth programmable transmission line pre-emphasis method and circuitMICREL INC·Filed 2010·Granted Feb 19, 2013·7 cites·12 claims
- 0780US3986045AHigh speed logic level converterADVANCED MICRO DEVICES INC·Filed 1975·Granted Oct 12, 1976·19 cites·11 claims
- 0880US2025331062A1Dual channel gateway device for machine-to-machine communicationSYSTECH CORP·Filed 2025·Application pending·0 cites
- 0978US12376192B2Dual channel gateway device for machine-to-machine communicationSYSTECH CORP·Filed 2024·Granted Jul 29, 2025·0 cites·16 claims
- 1078US10333734B2Control infrastructureSYSTECH CORP·Filed 2018·Granted Jun 25, 2019·2 cites·20 claims
- 1175US9076688B1Scatterometry for nested and isolated structuresGLOBALFOUNDRIES INC·Filed 2014·Granted Jul 7, 2015·4 cites·20 claims
- 1266US11979947B2Dual channel gateway device for machine-to-machine communicationSYSTECH CORP·Filed 2021·Granted May 7, 2024·0 cites·18 claims
- 1364US8723177B2Electrical test structure for devices employing high-k dielectrics or metal gatesLUTZ ROBERT C·Filed 2011·Granted May 13, 2014·1 cites·21 claims
- 1462US9123808B2Tuck strategy in transistor manufacturing flowGLOBALFOUNDRIES INC·Filed 2013·Granted Sep 1, 2015·1 cites·22 claims
- 1559US8379701B2High bandwidth dual programmable transmission line pre-emphasis method and circuitMICREL INC·Filed 2010·Granted Feb 19, 2013·1 cites·27 claims
- 1659US7145255B2Lateral programmable polysilicon structure incorporating polysilicon blocking diodeMICREL INC·Filed 2004·Granted Dec 5, 2006·7 cites·10 claims
- 1758US7443008B2Lateral programmable polysilicon structure incorporating polysilicon blocking diodeMICREL INC·Filed 2006·Granted Oct 28, 2008·1 cites·44 claims
- 1856US12462681B2Detection of malfunctions of the switching state detection of light signal systemsBOSCH GMBH ROBERT·Filed 2021·Granted Nov 4, 2025·0 cites·12 claims
- 1954US9236315B2Electrical test structure for devices employing high-k dielectrics or metal gatesGLOBALFOUNDRIES INC·Filed 2014·Granted Jan 12, 2016·0 cites·18 claims
- 2053US12482240B2Method for detecting and classifying objects in road trafficBOSCH GMBH ROBERT·Filed 2021·Granted Nov 25, 2025·0 cites·12 claims
- 2151US2023328815A1Automatic pairing of devices to a communication gatewaySYSTECH CORP·Filed 2021·Application pending·0 cites
- 2242US8685816B2Methods of forming semiconductor devices by forming semiconductor channel region materials prior to forming isolation structuresLUTZ ROBERT C·Filed 2012·Granted Apr 1, 2014·0 cites·27 claims
- 2340US2014220756A1Methods of forming semiconductor devices by forming a semiconductor layer above source/drain regions prior to removing a gate cap layerGLOBALFOUNDRIES INC·Filed 2013·Application pending·0 cites
- 2439US2013234138A1Electrical test structure for determining loss of high-k dielectric material and/or metal gate materialLUTZ ROBERT C·Filed 2012·Application pending·0 cites
- 2537US2013302954A1Methods of forming fins for a finfet device without performing a cmp processLUTZ ROBERT C·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →