Inventor · disambiguated record
Romi Mayder
Also filed as: MAYDER ROMI · MAYDER ROMI O
21 granted patents·10 pending applications·162 citations·filing 2001–2019
94Inventor score
Files withVERIGY PTE LTD SINGAPORE9MAYDER ROMI8MAYDER ROMI O3AGILENT TECHNOLOGIES INC2SILICON TEST SYSTEMS INC2
Top patents by PatentIndex Score
31 records- 0195US11423303B1Machine learning based methodology for adaptative equalizationXILINX INC·Filed 2019·Granted Aug 23, 2022·19 cites·20 claims
- 0291US6570397B2Timing calibration and timing calibration verification of electronic circuit testersAGILENT TECHNOLOGIES INC·Filed 2001·Granted May 27, 2003·58 cites·20 claims
- 0385US7147499B1Zero insertion force printed circuit assembly connector system and methodVERIGY IPCO·Filed 2005·Granted Dec 12, 2006·13 cites·19 claims
- 0484US8269515B2High impedance, high parallelism, high temperature memory test system architectureMAYDER ROMI O·Filed 2010·Granted Sep 18, 2012·6 cites·11 claims
- 0581US11621808B1Machine learning based methodology for signal waveform, eye diagram, and bit error rate (BER) bathtub predictionXILINX INC·Filed 2019·Granted Apr 4, 2023·3 cites·20 claims
- 0681US8410579B2Power distribution networkGHIA ATUL V·Filed 2010·Granted Apr 2, 2013·8 cites·20 claims
- 0780US7348791B1High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch designSILICON TEST SYSTEM INC·Filed 2007·Granted Mar 25, 2008·13 cites·29 claims
- 0877US9377802B1Dynamic configuration of equivalent series resistanceWYLAND CHRISTOPHER P·Filed 2012·Granted Jun 28, 2016·5 cites·19 claims
- 0975US7859277B2Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe arrayVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 28, 2010·7 cites·6 claims
- 1068US8710623B1Integrated circuit having a discrete capacitor mounted on a semiconductor dieMAYDER ROMI·Filed 2010·Granted Apr 29, 2014·4 cites·12 claims
- 1167US7768278B2High impedance, high parallelism, high temperature memory test system architectureVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Aug 3, 2010·4 cites·13 claims
- 1265US7460371B2Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sinkAGILENT TECHNOLOGIES INC·Filed 2006·Granted Dec 2, 2008·2 cites·26 claims
- 1362US7106081B2Parallel calibration system for a test deviceVERIGY IPCO·Filed 2004·Granted Sep 12, 2006·11 cites·17 claims
- 1461US7750650B2Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitryVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jul 6, 2010·1 cites·9 claims
- 1557US7459921B2Method and apparatus for a paddle board probe cardVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 2, 2008·2 cites·8 claims
- 1652US7501844B2Liquid cooled DUT card interface for wafer sort probingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Mar 10, 2009·1 cites·16 claims
- 1750US8925193B2Methods for fabricating circuit boardsMAYDER ROMI O·Filed 2010·Granted Jan 6, 2015·0 cites·22 claims
- 1847US7502974B2Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing setsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Mar 10, 2009·3 cites·14 claims
- 1947US7323897B2Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipmentVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Jan 29, 2008·1 cites·19 claims
- 2046US7541824B2Forced air cooling of components on a probecardVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 2, 2009·1 cites·7 claims
- 2146US2008099232A1Three-dimensional printed circuit board for use with electronic circuitrySILICON TEST SYSTEMS INC·Filed 2007·Application pending·0 cites
- 2242US2011089966A1Apparatus and systems for processing signals between a tester and a plurality of devices under testVERIGY PTE LTD SINGAPORE·Filed 2010·Application pending·0 cites
- 2341US2008142252A1Solid via with a contact pad for mating with an interposer of an ATE testerMAYDER ROMI·Filed 2006·Application pending·0 cites
- 2440US8305098B2Element usable with the method, and a standalone probe card tester formable using the methodMAYDER ROMI O·Filed 2008·Granted Nov 6, 2012·0 cites·6 claims
- 2540US2007278001A1Method and apparatus for a high frequency coaxial through hole via in multilayer printed circuit boardsMAYDER ROMI·Filed 2006·Application pending·0 cites
- 2640US2007278002A1Method and apparatus for a low thermal impedance printed circuit board assemblyMAYDER ROMI·Filed 2006·Application pending·0 cites
- 2738US2006236495A1Method and apparatus for non-contact cleaning of electronicsMAYDER ROMI·Filed 2005·Application pending·0 cites
- 2838US2008100323A1Low cost, high pin count, wafer sort automated test equipment (ate) device under test (dut) interface for testing electronic devices in high parallelismSILICON TEST SYSTEMS INC·Filed 2007·Application pending·0 cites
- 2936US2007090849A1Method and apparatus for a DUT contactorMAYDER ROMI·Filed 2005·Application pending·0 cites
- 3031US2007236301A1Inexpensive low phase noise high speed stabilized time baseMAYDER ROMI·Filed 2006·Application pending·0 cites
- 3123US2008169730A1Inverted mesa quartz crystal time base reference for automatic test equipmentMAYDER ROMI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →