Inventor · disambiguated record
Ron Naftali
Also filed as: NAFTALI RON
46 granted patents·7 pending applications·481 citations·filing 1998–2025
98Inventor score
Top patents by PatentIndex Score
53 records- 0196US7630069B2Illumination system for optical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Dec 8, 2009·27 cites·8 claims
- 0295US7468506B2Spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·55 cites·20 claims
- 0394US7468507B2Optical spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·37 cites·18 claims
- 0491US6657714B2Defect detection with enhanced dynamic rangeAPPLIED MATERIALS INC·Filed 2002·Granted Dec 2, 2003·43 cites·44 claims
- 0589US6124924AFocus error correction method and apparatusAPPLIED MATERIALS INC·Filed 1998·Granted Sep 26, 2000·73 cites·32 claims
- 0687US10504687B2Signal separator for a multi-beam charged particle inspection apparatusUNIV DELFT TECH·Filed 2018·Granted Dec 10, 2019·4 cites·24 claims
- 0787US7173694B2Method and system for detecting defectsAPPLIED MATERIALS INC·Filed 2006·Granted Feb 6, 2007·9 cites·50 claims
- 0885US2025308835A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0985US2025308836A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1084US6861660B2Process and assembly for non-destructive surface inspectionAPPLIED MATERIALS INC·Filed 2002·Granted Mar 1, 2005·22 cites·2 claims
- 1183US6882417B2Method and system for detecting defectsAPPLIED MATERIALS INC·Filed 2002·Granted Apr 19, 2005·25 cites·45 claims
- 1283US6809808B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2002·Granted Oct 26, 2004·23 cites·25 claims
- 1381US7460221B2Method and system for detecting defectsAPPLIED MATERIALS INC·Filed 2007·Granted Dec 2, 2008·5 cites·7 claims
- 1481US7109463B2Amplifier circuit with a switching device to provide a wide dynamic output rangeAPPLIED MATERIALS INC·Filed 2002·Granted Sep 19, 2006·17 cites·7 claims
- 1580US7428850B2Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Sep 30, 2008·8 cites·20 claims
- 1679US7973919B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2010·Granted Jul 5, 2011·3 cites·4 claims
- 1779US7030978B2System and method for inspection of a substrate that has a refractive indexAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Apr 18, 2006·17 cites·55 claims
- 1878US7924419B2Illumination system for optical inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2009·Granted Apr 12, 2011·3 cites·6 claims
- 1976US7053999B2Method and system for detecting defectsAPPLIED MATERIALS INC·Filed 2002·Granted May 30, 2006·10 cites·33 claims
- 2075US10811219B2Method for evaluating a region of an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Oct 20, 2020·3 cites·20 claims
- 2172US10395887B1Apparatus and method for inspecting a surface of a sample, using a multi-beam charged particle columnUNIV DELFT TECH·Filed 2018·Granted Aug 27, 2019·1 cites·20 claims
- 2272US7268343B2Method and system for detecting defectsAPPLIED MATERIALS INC·Filed 2005·Granted Sep 11, 2007·3 cites·10 claims
- 2372US6366352B1Optical inspection method and apparatus utilizing a variable angle designAPPLIED MATERIALS INC·Filed 1999·Granted Apr 2, 2002·32 cites·48 claims
- 2471US7184612B2Hardware configuration for parallel data processing without cross communicationAPPLIED MATERIALS INC·Filed 2003·Granted Feb 27, 2007·9 cites·2 claims
- 2571US6853475B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted Feb 8, 2005·11 cites·9 claims
- 2670US6914670B1Defect detection with enhanced dynamic rangeAPPLIED MATERIALS INC·Filed 2003·Granted Jul 5, 2005·7 cites·2 claims
- 2770US6898304B2Hardware configuration for parallel data processing without cross communicationAPPLIED MATERIALS INC·Filed 2000·Granted May 24, 2005·9 cites·13 claims
- 2869US7053395B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted May 30, 2006·10 cites·7 claims
- 2968US12436401B2Polarization optical systemAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 7, 2025·0 cites·16 claims
- 3068US6469784B2Optical inspection method and apparatus utilizing a variable angle designAPPLIED MATERIALS INC·Filed 2001·Granted Oct 22, 2002·7 cites·24 claims
- 3167US10421125B2Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocityAPPLIED MATERIALS INC·Filed 2017·Granted Sep 24, 2019·0 cites·20 claims
- 3266US12362131B2Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 15, 2025·0 cites·26 claims
- 3366US10307822B2Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturingAPPLIED MATERIALS INC·Filed 2017·Granted Jun 4, 2019·0 cites·22 claims
- 3465US2024280802A1Laser pulse cascadeAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 3563US8134699B2Illumination system for optical inspectionNAFTALI RON·Filed 2011·Granted Mar 13, 2012·1 cites·6 claims
- 3661US9997328B2System and method for forming a sealed chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Jun 12, 2018·1 cites·17 claims
- 3760US7498557B2Cascaded image intensifierAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Mar 3, 2009·1 cites·25 claims
- 3859US6831736B2Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Dec 14, 2004·5 cites·32 claims
- 3958US2025055241A1Pulse stretcher system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 4057US2024387140A1Multiple electron beam opticsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 4156US7714999B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted May 11, 2010·0 cites·25 claims
- 4256US2024248046A1Multi-head optical inspection systems and techniques for semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 4352US11803961B2Die-to-multi-die wafer inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Oct 31, 2023·0 cites·20 claims
- 4451US7463351B2Process and assembly for non-destructive surface inspectionAPPLIED MATERIALS INC·Filed 2005·Granted Dec 9, 2008·0 cites·13 claims
- 4549US10060736B1Near-field sensor height controlAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 28, 2018·0 cites·15 claims
- 4647US10068748B2Scanning an object using multiple mechanical stagesAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Sep 4, 2018·0 cites·20 claims
- 4747US9297692B2System and method for inspecting a sample using landing lensAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Mar 29, 2016·0 cites·20 claims
- 4846US11177048B2Method and system for evaluating objectsAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Nov 16, 2021·0 cites·11 claims
- 4945US10054551B2Inspection system and method for inspecting a sample by using a plurality of spaced apart beamsAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 21, 2018·0 cites·12 claims
- 5045US9835563B2Evaluation system and a method for evaluating a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →